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"jenn gwo hwu"的相关文件
显示项目 51-60 / 119 (共12页)
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| 臺大學術典藏 |
2018-09-10T08:09:40Z |
Edge field enhanced deep depletion phenomenon in MOS structures with ultra-thin gate oxides
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Cheng, J.-Y.;Lu, H.-T.;Yang, C.-Y.;Hwu, J.-G.; Cheng, J.-Y.; Lu, H.-T.; Yang, C.-Y.; Hwu, J.-G.; JENN-GWO HWU |
| 臺大學術典藏 |
2018-09-10T07:29:09Z |
Fluorinated thin gate oxides prepared by room temperature deposition followed by furnace oxidation
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Yeh, K.-L.; Jeng, M.-J.; Hwu, J.-G.; JENN-GWO HWU |
| 臺大學術典藏 |
2018-09-10T07:29:09Z |
Improvement in radiation hardness of oxide by successive irradiation-then-anneal treatments
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Hwu, J.-G.;Fu, S.-L.; Hwu, J.-G.; Fu, S.-L.; JENN-GWO HWU |
| 臺大學術典藏 |
2018-09-10T07:29:09Z |
Constant bias-temperature and constant charge-temperature agings for silicon oxide films of MOS devices
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Hwu, J.-G.;Chuang, J.-B.;Fu, S.-L.; Hwu, J.-G.; Chuang, J.-B.; Fu, S.-L.; JENN-GWO HWU |
| 臺大學術典藏 |
2018-09-10T07:29:08Z |
Characterization of stacked hafnium oxide (HfO2) / silicon dioxide (SiO2) metal-oxide-semiconductor (MOS) tunneling temperature sensors
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Wang, C.-Y.;Hwu, J.-G.; Wang, C.-Y.; Hwu, J.-G.; JENN-GWO HWU |
| 臺大學術典藏 |
2018-09-10T07:29:08Z |
Characterization of inversion tunneling current saturation behavior for MOS(p) capacitors with ultrathin oxides and high-k dielectrics
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Chen, C.-H.;Chuang, K.-C.;Hwu, J.-G.; Chen, C.-H.; Chuang, K.-C.; Hwu, J.-G.; JENN-GWO HWU |
| 臺大學術典藏 |
2018-09-10T07:29:08Z |
Characteristics and reliability of hafnium oxide dielectric stacks with room temperature grown interfacial anodic oxide
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Chang, C.-H.;Hwu, J.-G.; Chang, C.-H.; Hwu, J.-G.; JENN-GWO HWU |
| 臺大學術典藏 |
2018-09-10T07:29:08Z |
The effect of patterned susceptor on the thickness uniformity of rapid thermal oxides
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Lee, K.-C.; Chang, H.-Y.; Chang, H.; Hwu, J.-G.; Wung, T.-S.; JENN-GWO HWU |
| 臺大學術典藏 |
2018-09-10T07:29:08Z |
Improvement in the electrical properties of thin gate oxides by chemical-assisted electron stressing followed by annealing (CAESA)
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Shih, Y.-H.; Hwu, J.-G.; JENN-GWO HWU |
| 臺大學術典藏 |
2018-09-10T07:29:07Z |
Metal-oxide-semiconductor structure solar cell prepared by lowerature (<400°C) anodization technique
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Wang, C.-Y.;Hwu, J.-G.; Wang, C.-Y.; Hwu, J.-G.; JENN-GWO HWU |
显示项目 51-60 / 119 (共12页)
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