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教育部委託研究計畫      計畫執行:國立臺灣大學圖書館
 
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機構 日期 題名 作者
臺大學術典藏 2018-09-10T04:08:53Z Local thinning-induced oxide nonuniformity effect on the tunneling current of ultrathin gate oxide Hong, C.-C.; Chen, W.-R.; Hwu, J.-G.; JENN-GWO HWU
臺大學術典藏 2018-09-10T03:44:50Z Effect of oxide resistance on the characterization of interface trap density in MOS structures Lin, J.-J.; Hwu, J.-G.; JENN-GWO HWU
臺大學術典藏 2018-09-10T03:44:49Z Improvement in oxide thickness uniformity by repeated spike oxidation Hong, C.-C.; Lee, C.-Y.; Hsieh, Y.-L.; Liu, C.-C.; Fong, I.-K.; Hwu, J.-G.; JENN-GWO HWU
臺大學術典藏 2018-09-10T03:44:49Z Degradation in metal-oxide-semiconductor structure with ultrathin gate oxide due to external compressive stress Hong, C.-C.; Hwu, J.-G.; JENN-GWO HWU
臺大學術典藏 2018-09-10T03:44:49Z Application of anodization to reoxidize silicon nitride film Lin, Y.-P.; Hwu, J.-G.; JENN-GWO HWU
臺大學術典藏 2018-09-10T03:44:49Z Improvement of hot-carrier resistance and radiation hardness of nMOSFETs by irradiation-then-anneal treatments Chang-Liao, K.-S.;Hwu, J.-G.; Chang-Liao, K.-S.; Hwu, J.-G.; JENN-GWO HWU
臺大學術典藏 2018-09-10T03:44:48Z Ultra-thin gate oxides prepared by alternating current anodization of silicon followed by rapid thermal anneal Chen, Y.-C.; Lee, C.-Y.; Hwu, J.-G.; JENN-GWO HWU
臺大學術典藏 2018-09-10T03:44:48Z Stress effect on the kinetics of silicon thermal oxidation Yen, J.-Y.; Hwu, J.-G.; JENN-GWO HWU
臺大學術典藏 2011 Comprehensive study on negative capacitance effect observed in MOS(n) capacitors with ultrathin gate oxides Chang, S.-J.;Hwu, J.-G.; Chang, S.-J.; Hwu, J.-G.; JENN-GWO HWU
國立高雄師範大學 2005 The Effect of Photon Illumination in Rapid Thermal Processing on the Characteristics of MOS Structures with Ultra-thin Oxides Examined by Substrate Injection Chia-Hong Huang;Jenn-Gwo Hwu; 黃嘉宏

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