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Institution Date Title Author
國立交通大學 2014-12-08T15:17:01Z Mismatches after hot-carrier injection in advanced complementary metal-oxide-semiconductor technology particularly for analog applications Chen, SY; Lin, JC; Chen, HW; Lin, HC; Jhou, ZW; Chou, S; Ko, J; Lei, TF; Haung, HS
國立交通大學 2014-12-08T15:16:56Z Investigation of DC hot-carrier degradation at elevated temperatures for n-channel metal-oxide-semiconductor field-effect-transistor of 0.13 mu m technology Lin, JC; Chen, SY; Chen, HW; Jhou, ZW; Lin, HC; Chou, S; Ko, J; Lei, TF; Haung, HS

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