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"jia han li"的相关文件
显示项目 156-165 / 280 (共28页)
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| 臺大學術典藏 |
2020-01-17T07:45:18Z |
The influence of propagating and evanescent waves on the focusing properties of zone plate structures
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Li, J.-H.; Gheng, Y.-W.; Ghue, Y.-C.; Lin, G.-H.; Sheu, T.W.-H.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:18Z |
The inuence of granularity on the subwavelength performance of a negative refractive index lens
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JIA-HAN LI;Li, J.;Webb, K.J.; Webb, K.J.; Li, J.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:18Z |
The inuence of granularity on the subwavelength performance of a negative refractive index lens
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JIA-HAN LI;Li, J.;Webb, K.J.; Webb, K.J.; Li, J.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:18Z |
Surface-enhanced Raman scattering from a resonant waveguide mode
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JIA-HAN LI; Li, J.; JIA-HAN LI;Li, J.;Webb, K.J.; Webb, K.J. |
| 臺大學術典藏 |
2020-01-17T07:45:18Z |
Surface-enhanced Raman scattering from a resonant waveguide mode
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JIA-HAN LI; Li, J.; JIA-HAN LI;Li, J.;Webb, K.J.; Webb, K.J. |
| 臺大學術典藏 |
2020-01-17T07:45:17Z |
Fresnel zone plate manufacturability analysis for direct-write lithography by simulating focusing and patterning performance versus fabrication errors
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Tsai, K.-Y.; Chen, S.-Y.; Pei, T.-H.; Li, J.-H.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:17Z |
Efficient scattering simulations for equivalent extreme ultraviolet mask multilayer structures by modified transmission line theory and finite-difference time-domain method
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Lee, Y.-M.; Li, J.-H.; Ng, P.C.W.; Pei, T.-H.; Wang, F.-M.; Tsai, K.-Y.; Chen, A.C.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:17Z |
Terahertz field enhancement in doped semiconductor slot cavities
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JIA-HAN LI; Webb, K.J.; Li, J. |
| 臺大學術典藏 |
2020-01-17T07:45:17Z |
Using transmission line theory to calculate equivalent refractive index of EUV mask multilayer structures for efficient scattering simulation by finite-difference time-domain method
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Lee, Y.-M.; Li, J.-H.; Ng, P.C.W.; Pei, T.-H.; Wang, F.-M.; Tsai, K.-Y.; Chen, A.C.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:17Z |
Stochastic simulation of photon scattering for EUV mask defect inspection
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Pei, T.-H.; Tsai, K.-Y.; Li, J.-H.; JIA-HAN LI |
显示项目 156-165 / 280 (共28页)
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