| 臺大學術典藏 |
2020-01-17T07:45:09Z |
Anti-reflection textured structures by wet etching and island lithography for surface-enhanced Raman spectroscopy
|
JIA-HAN LI; Hsueh, C.-H.; Li, J.-H.; Nagao, T.; Chao, B.-K.; Cheng, H.-H.; Nien, L.-W.; Chen, M.-J. |
| 臺大學術典藏 |
2020-01-17T07:45:07Z |
Free-standing gold elliptical nanoantenna with tunable wavelength in near-infrared region for enhanced Raman spectroscopy
|
JIA-HAN LI; Hsueh, C.-H.; Li, J.-H.; Chao, B.-K.; Gu, B.; Lin, S.-C.; Hatab, N.A. |
| 臺大學術典藏 |
2020-01-17T07:45:07Z |
Development of a 3D staggered FDTD scheme for solving Maxwell's equations in Drude medium
|
Sheu, T.W.H.; Wang, Y.C.; Li, J.H.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:06Z |
Suspended graphene with periodic dimer nanostructure on Si cavities for surface-enhanced Raman scattering applications
|
Ho, H.-C.; Nien, L.-W.; Li, J.-H.; Hsueh, C.-H.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:06Z |
Simulation of Maxwell's Equations on GPU Using a High-Order Error-Minimized Scheme
|
Sheu, T.W.H.; Wang, S.Z.; Li, J.H.; Smith, M.R.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:05Z |
Optical properties of au-based and pt-based alloys for infrared device applications: A combined first principle and electromagnetic simulation study
|
Chiu, M.-H.; Li, J.-H.; Nagao, T.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:05Z |
Molecular Sensing and Color Manipulation Based on Dimension-Controlled Plasmon-Enhanced Silicon Nanotube SERS Substrates
|
JIA-HAN LI; Hsueh, C.-H.; Li, J.-H.; Ho, H.-C.; Nien, L.-W.; Lai, Y.-C. |
| 臺大學術典藏 |
2020-01-17T07:45:05Z |
Optical simulations of wavefront aberrations of interpenetrating polymer network Hydrogel's artificial cornea
|
Hsieh, C.-T.; Li, J.-H.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:05Z |
First-principles study of the optical properties of AA-stacked bilayer graphene
|
JIA-HAN LI; Li, J.-H.; Sheu, T.W.-H.; Zhang, J.-F.; Chiu, M.-H.; Hsieh, C.-T. |
| 臺大學術典藏 |
2020-01-17T07:45:04Z |
Prediction of evanescent coupling efficiency in two parallel silica nanowires
|
Sheu, T.W.H.; Kao, C.Y.; Chang, Y.W.; Li, J.H.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:04Z |
Numerical study of tunable photonic nanojets generated by biocompatible hydrogel core-shell microspheres for surface-enhanced Raman scattering applications
|
Wang, Y.-J.; Dai, C.-A.; Li, J.-H.; JIA-HAN LI |
| 臺大學術典藏 |
2019-10-31T07:58:01Z |
Fabrication of metrology test structures with helium ion beam direct write
|
KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai*;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai*; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:01Z |
Fabrication of metrology test structures with helium ion beam direct write
|
KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai*;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai*; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:00Z |
Fabrication of metrology test structures with helium ion beam direct write
|
KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai*;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai*; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:00Z |
Fabrication of metrology test structures with helium ion beam direct write
|
KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai*;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai*; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:57:58Z |
Fabrication of metrology test structures with programmed imperfection using helium ion beam direct write
|
KUEN-YU TSAI;Jia-Han Li;Kuen-Yu Tsai*;Sheng-Wei Chien; Sheng-Wei Chien; Kuen-Yu Tsai*; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:57:58Z |
Fabrication of metrology test structures with programmed imperfection using helium ion beam direct write
|
KUEN-YU TSAI;Jia-Han Li;Kuen-Yu Tsai*;Sheng-Wei Chien; Sheng-Wei Chien; Kuen-Yu Tsai*; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2019 |
Surface plasmons excited by multiple layer grating
|
Wu, C.-L.; Hsueh, C.-H.; Li, J.-H.; JIA-HAN LI |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Comparison of the vectorial diffraction theory and Fraunhofer approximation method on diffractive images of Fresnel zone plates
|
Ting-Hang Pei;Kuen-Yu Tsai;Jia-Han Li; Ting-Hang Pei; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Comparison of the vectorial diffraction theory and Fraunhofer approximation method on diffractive images of Fresnel zone plates
|
Ting-Hang Pei;Kuen-Yu Tsai;Jia-Han Li; Ting-Hang Pei; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Supplementary zones-surrounded Fresnel zone plate with enhanced optical resolution
|
Yen-Min Lee;Szu-Hung Chen;Chen-Pin Hsu;Pei-Chuen Chiou;Kuen-Yu Tsai;Tien-Tung Chung;Cheng-Han Tsai;Zhan-Yu Liu;Jia-Han Li; Yen-Min Lee; Szu-Hung Chen; Chen-Pin Hsu; Pei-Chuen Chiou; Kuen-Yu Tsai; Tien-Tung Chung; Cheng-Han Tsai; Zhan-Yu Liu; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Supplementary zones-surrounded Fresnel zone plate with enhanced optical resolution
|
Yen-Min Lee;Szu-Hung Chen;Chen-Pin Hsu;Pei-Chuen Chiou;Kuen-Yu Tsai;Tien-Tung Chung;Cheng-Han Tsai;Zhan-Yu Liu;Jia-Han Li; Yen-Min Lee; Szu-Hung Chen; Chen-Pin Hsu; Pei-Chuen Chiou; Kuen-Yu Tsai; Tien-Tung Chung; Cheng-Han Tsai; Zhan-Yu Liu; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Multilayer Mirror Structure (多層反射鏡結構)
|
Jia-Han Li;Yen-Min Lee;Kuen-Yu Tsai; Jia-Han Li; Yen-Min Lee; Kuen-Yu Tsai; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Multilayer Mirror Structure (多層反射鏡結構)
|
Jia-Han Li;Yen-Min Lee;Kuen-Yu Tsai; Jia-Han Li; Yen-Min Lee; Kuen-Yu Tsai; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:00:24Z |
Refractive index and effective thickness measurement system for the RGB color filter coatings with absorption and scattering properties
|
Yen-Min Lee;Hsin-Hung Cheng;Jia-Han Li;Kuen-Yu Tsai;Yu-Tian Sheng; Yen-Min Lee; Hsin-Hung Cheng; Jia-Han Li; Kuen-Yu Tsai; Yu-Tian Sheng; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:00:24Z |
Refractive index and effective thickness measurement system for the RGB color filter coatings with absorption and scattering properties
|
Yen-Min Lee;Hsin-Hung Cheng;Jia-Han Li;Kuen-Yu Tsai;Yu-Tian Sheng; Yen-Min Lee; Hsin-Hung Cheng; Jia-Han Li; Kuen-Yu Tsai; Yu-Tian Sheng; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:00:24Z |
Optical scatterometry system for detecting specific line edge roughness of resist gratings subjected to detector noises
|
Yen-Min Lee;Jia-Han Li;Fu-Min Wang;Hsin-Hung Cheng;Yu-Tian Shen;Kuen-Yu Tsai;Jason Shieh;Alek Chen; Yen-Min Lee; Jia-Han Li; Fu-Min Wang; Hsin-Hung Cheng; Yu-Tian Shen; Kuen-Yu Tsai; Jason Shieh; Alek Chen; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:00:24Z |
Optical scatterometry system for detecting specific line edge roughness of resist gratings subjected to detector noises
|
Yen-Min Lee;Jia-Han Li;Fu-Min Wang;Hsin-Hung Cheng;Yu-Tian Shen;Kuen-Yu Tsai;Jason Shieh;Alek Chen; Yen-Min Lee; Jia-Han Li; Fu-Min Wang; Hsin-Hung Cheng; Yu-Tian Shen; Kuen-Yu Tsai; Jason Shieh; Alek Chen; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:00:24Z |
Direct-scatterometry-enabled PEC model calibration with two-dimensional layouts
|
Yi-Yeh Yang;Hsuan-Ping Lee;Chun-Hung Liu;Hao-Yun Yu;Kuen-Yu Tsai;Jia-Han Li; Yi-Yeh Yang; Hsuan-Ping Lee; Chun-Hung Liu; Hao-Yun Yu; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:00:24Z |
Direct-scatterometry-enabled PEC model calibration with two-dimensional layouts
|
Yi-Yeh Yang;Hsuan-Ping Lee;Chun-Hung Liu;Hao-Yun Yu;Kuen-Yu Tsai;Jia-Han Li; Yi-Yeh Yang; Hsuan-Ping Lee; Chun-Hung Liu; Hao-Yun Yu; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:00:24Z |
A New EUV Mask Blank Defect Inspection Method with Coherent Diffraction Imaging
|
Ding Qi;Kuen-Yu Tsai;Jia-Han Li; Ding Qi; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:00:24Z |
A New EUV Mask Blank Defect Inspection Method with Coherent Diffraction Imaging
|
Ding Qi;Kuen-Yu Tsai;Jia-Han Li; Ding Qi; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T09:50:34Z |
Void-based photonic crystal mirror with high-reflectivity and low-dissipation for extreme-ultraviolet radiation
|
Yen-Min Lee;Jia-Han Li;Kuen-Yu Tsai; Yen-Min Lee; Jia-Han Li; Kuen-Yu Tsai; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T09:50:34Z |
Void-based photonic crystal mirror with high-reflectivity and low-dissipation for extreme-ultraviolet radiation
|
Yen-Min Lee;Jia-Han Li;Kuen-Yu Tsai; Yen-Min Lee; Jia-Han Li; Kuen-Yu Tsai; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T09:50:34Z |
Direct-scatterometry-enabled optical-proximity-correction-model calibration
|
Chih-Yu Chen;Philip C. W. Ng;Chun-Hung Liu;Yu-Tian Shen;Kuen-Yu Tsai;Jia-Han Li;Jason J. Shieh;Alek C. Chen; Chih-Yu Chen; Philip C. W. Ng; Chun-Hung Liu; Yu-Tian Shen; Kuen-Yu Tsai; Jia-Han Li; Jason J. Shieh; Alek C. Chen; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T09:50:34Z |
Direct-scatterometry-enabled optical-proximity-correction-model calibration
|
Chih-Yu Chen;Philip C. W. Ng;Chun-Hung Liu;Yu-Tian Shen;Kuen-Yu Tsai;Jia-Han Li;Jason J. Shieh;Alek C. Chen; Chih-Yu Chen; Philip C. W. Ng; Chun-Hung Liu; Yu-Tian Shen; Kuen-Yu Tsai; Jia-Han Li; Jason J. Shieh; Alek C. Chen; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T09:25:00Z |
Direct-scatterometry-enabled lithography model calibration
|
Chih-Yu Chen;Kuen-Yu Tsai;Yu-Tian Shen;Yen-Min Lee;Jia-Han Li;Jason J. Shieh;Alek C. Chen; Chih-Yu Chen; Kuen-Yu Tsai; Yu-Tian Shen; Yen-Min Lee; Jia-Han Li; Jason J. Shieh; Alek C. Chen; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T09:25:00Z |
Direct-scatterometry-enabled lithography model calibration
|
Chih-Yu Chen;Kuen-Yu Tsai;Yu-Tian Shen;Yen-Min Lee;Jia-Han Li;Jason J. Shieh;Alek C. Chen; Chih-Yu Chen; Kuen-Yu Tsai; Yu-Tian Shen; Yen-Min Lee; Jia-Han Li; Jason J. Shieh; Alek C. Chen; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T09:25:00Z |
Solution-refined method for solving large-scale computation problems: Taking the Laplace's equation as an example
|
Yen-Min Lee;Jia-Han Li;Tony Wen-Hann Sheu;Kuen-Yu Tsai;Jia-Yush Yen; Yen-Min Lee; Jia-Han Li; Tony Wen-Hann Sheu; Kuen-Yu Tsai; Jia-Yush Yen; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T09:25:00Z |
Solution-refined method for solving large-scale computation problems: Taking the Laplace's equation as an example
|
Yen-Min Lee;Jia-Han Li;Tony Wen-Hann Sheu;Kuen-Yu Tsai;Jia-Yush Yen; Yen-Min Lee; Jia-Han Li; Tony Wen-Hann Sheu; Kuen-Yu Tsai; Jia-Yush Yen; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T08:46:35Z |
Multilayer Mirror Structure
|
Jia-Han Li;Yen-Min Lee;Kuen-Yu Tsai; Jia-Han Li; Yen-Min Lee; Kuen-Yu Tsai; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T08:46:35Z |
Multilayer Mirror Structure
|
Jia-Han Li;Yen-Min Lee;Kuen-Yu Tsai; Jia-Han Li; Yen-Min Lee; Kuen-Yu Tsai; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T08:46:34Z |
Method for Calibrating A Manufacturing Process Model (National Taiwan University/ASML Holding N.V.)
|
Kuen-Yu Tsai;Alek C. Chen;Jia-Han Li; Kuen-Yu Tsai; Alek C. Chen; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T08:46:34Z |
Method for Calibrating A Manufacturing Process Model (National Taiwan University/ASML Holding N.V.)
|
Kuen-Yu Tsai;Alek C. Chen;Jia-Han Li; Kuen-Yu Tsai; Alek C. Chen; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T08:46:33Z |
Optical metrology of shape-varying nano-patterned gratings by analyzing the scattering signals in their pupil images
|
Yen-Min Lee; Jia-Han Li; Fu-Min Wang; Hsin-Hung Cheng; Yu-Tian Shen; Kuen-Yu Tsai; Alek C. Chen; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T08:46:32Z |
Fully model-based methodology for simultaneous correction of extreme ultraviolet mask shadowing and proximity effects
|
Philip C. W. Ng; Kuen-Yu Tsai; Yen-Min Lee; Fu-Min Wang; Jia-Han Li; Alek C. Chen; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T08:18:26Z |
Fabrication of metrology test structures with programmed line edge roughness using electron beam direct write
|
Fu-Min Wang;Kuen-Yu Tsai;Jia-Han Li;Alek C. Chen;Yen-Min Lee;Yu-Tian Shen;Hsin-Hung Cheng;Chieh-Hsiang Kuan; Fu-Min Wang; Kuen-Yu Tsai; Jia-Han Li; Alek C. Chen; Yen-Min Lee; Yu-Tian Shen; Hsin-Hung Cheng; Chieh-Hsiang Kuan; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T08:18:26Z |
Fabrication of metrology test structures with programmed line edge roughness using electron beam direct write
|
Fu-Min Wang;Kuen-Yu Tsai;Jia-Han Li;Alek C. Chen;Yen-Min Lee;Yu-Tian Shen;Hsin-Hung Cheng;Chieh-Hsiang Kuan; Fu-Min Wang; Kuen-Yu Tsai; Jia-Han Li; Alek C. Chen; Yen-Min Lee; Yu-Tian Shen; Hsin-Hung Cheng; Chieh-Hsiang Kuan; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T08:18:26Z |
Iterative finite-difference method for analyzing fabrication errors of lens-misaligned electron-beam direct-write lithography system
|
Yen-Min Lee;Jia-Han Li;Sheng-Yung Chen;Shiau-Yi Ma;Kuen-Yu Tsai;Tony W. H. Sheu;Jia-Yush Yen; Yen-Min Lee; Jia-Han Li; Sheng-Yung Chen; Shiau-Yi Ma; Kuen-Yu Tsai; Tony W. H. Sheu; Jia-Yush Yen; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T08:18:26Z |
Iterative finite-difference method for analyzing fabrication errors of lens-misaligned electron-beam direct-write lithography system
|
Yen-Min Lee;Jia-Han Li;Sheng-Yung Chen;Shiau-Yi Ma;Kuen-Yu Tsai;Tony W. H. Sheu;Jia-Yush Yen; Yen-Min Lee; Jia-Han Li; Sheng-Yung Chen; Shiau-Yi Ma; Kuen-Yu Tsai; Tony W. H. Sheu; Jia-Yush Yen; KUEN-YU TSAI |
