| 臺大學術典藏 |
2020-01-17T07:45:05Z |
Optical properties of au-based and pt-based alloys for infrared device applications: A combined first principle and electromagnetic simulation study
|
Chiu, M.-H.; Li, J.-H.; Nagao, T.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:05Z |
Molecular Sensing and Color Manipulation Based on Dimension-Controlled Plasmon-Enhanced Silicon Nanotube SERS Substrates
|
JIA-HAN LI; Hsueh, C.-H.; Li, J.-H.; Ho, H.-C.; Nien, L.-W.; Lai, Y.-C. |
| 臺大學術典藏 |
2020-01-17T07:45:05Z |
Optical simulations of wavefront aberrations of interpenetrating polymer network Hydrogel's artificial cornea
|
Hsieh, C.-T.; Li, J.-H.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:05Z |
First-principles study of the optical properties of AA-stacked bilayer graphene
|
JIA-HAN LI; Li, J.-H.; Sheu, T.W.-H.; Zhang, J.-F.; Chiu, M.-H.; Hsieh, C.-T. |
| 臺大學術典藏 |
2020-01-17T07:45:04Z |
Prediction of evanescent coupling efficiency in two parallel silica nanowires
|
Sheu, T.W.H.; Kao, C.Y.; Chang, Y.W.; Li, J.H.; JIA-HAN LI |
| 臺大學術典藏 |
2020-01-17T07:45:04Z |
Numerical study of tunable photonic nanojets generated by biocompatible hydrogel core-shell microspheres for surface-enhanced Raman scattering applications
|
Wang, Y.-J.; Dai, C.-A.; Li, J.-H.; JIA-HAN LI |
| 臺大學術典藏 |
2019-10-31T07:58:01Z |
Fabrication of metrology test structures with helium ion beam direct write
|
KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai*;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai*; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:01Z |
Fabrication of metrology test structures with helium ion beam direct write
|
KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai*;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai*; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:00Z |
Fabrication of metrology test structures with helium ion beam direct write
|
KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai*;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai*; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:58:00Z |
Fabrication of metrology test structures with helium ion beam direct write
|
KUEN-YU TSAI;Chao-Te Lee;Chit-Sung Hong;Bor-Yuan Shew;Jia-Han Li;Kuen-Yu Tsai*;Chun-Hung Liu;Sheng-Yung Chen;Sheng-Wei Chien;Chien-Lin Lee; Chien-Lin Lee; Sheng-Wei Chien; Sheng-Yung Chen; Chun-Hung Liu; Kuen-Yu Tsai*; Jia-Han Li; Bor-Yuan Shew; Chit-Sung Hong; Chao-Te Lee; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:57:58Z |
Fabrication of metrology test structures with programmed imperfection using helium ion beam direct write
|
KUEN-YU TSAI;Jia-Han Li;Kuen-Yu Tsai*;Sheng-Wei Chien; Sheng-Wei Chien; Kuen-Yu Tsai*; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2019-10-31T07:57:58Z |
Fabrication of metrology test structures with programmed imperfection using helium ion beam direct write
|
KUEN-YU TSAI;Jia-Han Li;Kuen-Yu Tsai*;Sheng-Wei Chien; Sheng-Wei Chien; Kuen-Yu Tsai*; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2019 |
Surface plasmons excited by multiple layer grating
|
Wu, C.-L.; Hsueh, C.-H.; Li, J.-H.; JIA-HAN LI |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Comparison of the vectorial diffraction theory and Fraunhofer approximation method on diffractive images of Fresnel zone plates
|
Ting-Hang Pei;Kuen-Yu Tsai;Jia-Han Li; Ting-Hang Pei; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Comparison of the vectorial diffraction theory and Fraunhofer approximation method on diffractive images of Fresnel zone plates
|
Ting-Hang Pei;Kuen-Yu Tsai;Jia-Han Li; Ting-Hang Pei; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Supplementary zones-surrounded Fresnel zone plate with enhanced optical resolution
|
Yen-Min Lee;Szu-Hung Chen;Chen-Pin Hsu;Pei-Chuen Chiou;Kuen-Yu Tsai;Tien-Tung Chung;Cheng-Han Tsai;Zhan-Yu Liu;Jia-Han Li; Yen-Min Lee; Szu-Hung Chen; Chen-Pin Hsu; Pei-Chuen Chiou; Kuen-Yu Tsai; Tien-Tung Chung; Cheng-Han Tsai; Zhan-Yu Liu; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Supplementary zones-surrounded Fresnel zone plate with enhanced optical resolution
|
Yen-Min Lee;Szu-Hung Chen;Chen-Pin Hsu;Pei-Chuen Chiou;Kuen-Yu Tsai;Tien-Tung Chung;Cheng-Han Tsai;Zhan-Yu Liu;Jia-Han Li; Yen-Min Lee; Szu-Hung Chen; Chen-Pin Hsu; Pei-Chuen Chiou; Kuen-Yu Tsai; Tien-Tung Chung; Cheng-Han Tsai; Zhan-Yu Liu; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Multilayer Mirror Structure (多層反射鏡結構)
|
Jia-Han Li;Yen-Min Lee;Kuen-Yu Tsai; Jia-Han Li; Yen-Min Lee; Kuen-Yu Tsai; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:26:03Z |
Multilayer Mirror Structure (多層反射鏡結構)
|
Jia-Han Li;Yen-Min Lee;Kuen-Yu Tsai; Jia-Han Li; Yen-Min Lee; Kuen-Yu Tsai; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:00:24Z |
Refractive index and effective thickness measurement system for the RGB color filter coatings with absorption and scattering properties
|
Yen-Min Lee;Hsin-Hung Cheng;Jia-Han Li;Kuen-Yu Tsai;Yu-Tian Sheng; Yen-Min Lee; Hsin-Hung Cheng; Jia-Han Li; Kuen-Yu Tsai; Yu-Tian Sheng; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:00:24Z |
Refractive index and effective thickness measurement system for the RGB color filter coatings with absorption and scattering properties
|
Yen-Min Lee;Hsin-Hung Cheng;Jia-Han Li;Kuen-Yu Tsai;Yu-Tian Sheng; Yen-Min Lee; Hsin-Hung Cheng; Jia-Han Li; Kuen-Yu Tsai; Yu-Tian Sheng; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:00:24Z |
Optical scatterometry system for detecting specific line edge roughness of resist gratings subjected to detector noises
|
Yen-Min Lee;Jia-Han Li;Fu-Min Wang;Hsin-Hung Cheng;Yu-Tian Shen;Kuen-Yu Tsai;Jason Shieh;Alek Chen; Yen-Min Lee; Jia-Han Li; Fu-Min Wang; Hsin-Hung Cheng; Yu-Tian Shen; Kuen-Yu Tsai; Jason Shieh; Alek Chen; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:00:24Z |
Optical scatterometry system for detecting specific line edge roughness of resist gratings subjected to detector noises
|
Yen-Min Lee;Jia-Han Li;Fu-Min Wang;Hsin-Hung Cheng;Yu-Tian Shen;Kuen-Yu Tsai;Jason Shieh;Alek Chen; Yen-Min Lee; Jia-Han Li; Fu-Min Wang; Hsin-Hung Cheng; Yu-Tian Shen; Kuen-Yu Tsai; Jason Shieh; Alek Chen; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:00:24Z |
Direct-scatterometry-enabled PEC model calibration with two-dimensional layouts
|
Yi-Yeh Yang;Hsuan-Ping Lee;Chun-Hung Liu;Hao-Yun Yu;Kuen-Yu Tsai;Jia-Han Li; Yi-Yeh Yang; Hsuan-Ping Lee; Chun-Hung Liu; Hao-Yun Yu; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI |
| 臺大學術典藏 |
2018-09-10T15:00:24Z |
Direct-scatterometry-enabled PEC model calibration with two-dimensional layouts
|
Yi-Yeh Yang;Hsuan-Ping Lee;Chun-Hung Liu;Hao-Yun Yu;Kuen-Yu Tsai;Jia-Han Li; Yi-Yeh Yang; Hsuan-Ping Lee; Chun-Hung Liu; Hao-Yun Yu; Kuen-Yu Tsai; Jia-Han Li; KUEN-YU TSAI |
