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Taiwan Academic Institutional Repository >
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"jian fu yen"
Showing items 16-32 of 32 (1 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:22:41Z |
Suppress temperature instability of InGaZnO thin film transistors by N2O plasma treatment, including thermal-induced hole trapping phenomenon under gate bias stress
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Chang, Geng-Wei; Chang, Ting-Chang; Jhu, Jhe-Ciou; Tsai, Tsung-Ming; Syu, Yong-En; Chang, Kuan-Chang; Tai, Ya-Hsiang; Jian, Fu-Yen; Hung, Ya-Chi |
| 國立交通大學 |
2014-12-08T15:21:39Z |
Developments in nanocrystal memory
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Chang, Ting-Chang; Jian, Fu-Yen; Chen, Shih-Cheng; Tsai, Yu-Ting |
| 國立交通大學 |
2014-12-08T15:21:35Z |
Paraffin wax passivation layer improvements in electrical characteristics of bottom gate amorphous indium-gallium-zinc oxide thin-film transistors
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Chang, Geng-Wei; Chang, Ting-Chang; Syu, Yong-En; Tsai, Tsung-Ming; Chang, Kuan-Chang; Tu, Chun-Hao; Jian, Fu-Yen; Hung, Ya-Chi; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:20:48Z |
Investigating the improvement of resistive switching trends after post-forming negative bias stress treatment
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Tseng, Hsueh-Chih; Chang, Ting-Chang; Huang, Jheng-Jie; Yang, Po-Chun; Chen, Yu-Ting; Jian, Fu-Yen; Sze, S. M.; Tsai, Ming-Jinn |
| 國立交通大學 |
2014-12-08T15:12:03Z |
Charge-Trapping-Induced Parasitic Capacitance and Resistance in SONOS TFTs Under Gate Bias Stress
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Li, Hung-Wei; Chen, Shih-Ching; Chuang, Ying-Shao; Chen, Te-Chih; Tai, Ya-Hsiang; Lee, Ming-Hsien; Chen, Jim-Shone |
| 國立交通大學 |
2014-12-08T15:11:54Z |
Anomalous on-current and subthreshold swing improvement in low-temperature polycrystalline-silicon thin-film transistors under Gate bias stress
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Li, Hung-Wei; Chen, Yi-Chuan; Chen, Te-Chih; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:10:21Z |
Illumination-Assisted Negative Bias Temperature Instability Degradation in Low Temperature Polycrystalline Silicon Thin-Film Transistors
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Hsu, Wei-Che; Chen, Shih-Ching; Li, Hung-Wei; Tu, Kuan-Jen; Jian, Fu-Yen; Chen, Te-Chih |
| 國立交通大學 |
2014-12-08T15:08:23Z |
Anomalous Capacitance Induced by GIDL in P-Channel LTPS TFTs
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Chen, Shih-Ching; Jian, Fu-Yen; Li, Hung-Wei; Chen, Te-Chih; Weng, Chi-Feng; Lu, Jin; Hsu, Wei-Che |
| 國立交通大學 |
2014-12-08T15:08:02Z |
Unusual Threshold Voltage Shift Caused by Self-Heating-Induced Charge Trapping Effect
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Jian, Fu-Yen; Chang, Ting-Chang; Chu, An-Kuo; Chen, Te-Chih; Chen, Shih-Ching; Lin, Chia-Sheng; Li, Hung-Wei; Lee, Ming-Hsien; Chen, Jim-Shone; Shih, Ching-Chieh |
| 國立交通大學 |
2014-12-08T15:07:52Z |
Degradation of Low Temperature Polycrystalline Silicon Thin Film Transistors under Negative Bias Temperature Instability Stress with Illumination Effect
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Li, Hung-Wei; Hsu, Wei-Che; Chen, Shih-Ching; Tai, Ya-Hsiang; Jian, Fu-Yen; Chen, Te-Chih; Tu, Kuan-Jen; Wu, Hsing-Hua; Chen, Yi-Chan |
| 國立交通大學 |
2014-12-08T15:07:50Z |
Analysis of Anomalous Capacitance Induced by TAGIDL in p-Channel LTPS TFTs
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Li, Hung-Wei; Chen, Shih-Ching; Jian, Fu-Yen; Chuang, Ying-Shao; Chen, Te-Chih; Chen, Yu-Chun; Tai, Ya-Hsiang |
| 國立成功大學 |
2014-06 |
Temperature-Dependent Instability of Bias Stress in InGaZnO Thin-Film Transistors
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Chang, Geng-Wei; Chang, Ting-Chang; Jhu, Jhe-Ciou; Tsai, Tsung-Ming; Chang, Kuan-Chang; Syu, Yong-En; Tai, Ya-Hsiang; Jian, Fu-Yen; Hung, Ya-Chi |
| 國立成功大學 |
2013-09 |
Analyzing the effects of ambient dependence for InGaZnO TFTs under illuminated bias stress
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Chen, Te-Chih; Chang, Ting-Chang; Hsieh, Tien-Yu; Tsai, Ming-Yen; Tsai, Chih-Tsung; Chen, Shih-Ching; Lin, Chia-Sheng; Jian, Fu-Yen |
| 國立成功大學 |
2013-09 |
Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen; Lin, Chia-Sheng; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2013-02-01 |
Investigating bipolar resistive switching characteristics in filament type and interface type BON-based resistive switching memory
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Tseng, Hsueh-Chih; Chang, Ting-Chang; Cheng, Kai-Hung; Huang, Jheng-Jie; Chen, Yu-Ting; Jian, Fu-Yen; Sze, Simon M.; Tsai, Ming-Jinn; Chu, Ann-Kuo; Wang, Ying-Lang |
| 國立成功大學 |
2012-05-28 |
The asymmetrical degradation behavior on drain bias stress under illumination for InGaZnO thin film transistors
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Huang, Sheng-Yao; Chang, Ting-Chang; Lin, Li-Wei; Yang, Man-Chun; Chen, Min-Chen; Jhu, Jhe-Ciou; Jian, Fu-Yen |
| 國立成功大學 |
2012 |
Thermal Effect on the Gate-Drain Bias Stress for Amorphous InGaZnO Thin Film Transistors
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Huang, Sheng-Yao; Chang, Ting-Chang; Chen, Min-Chen; Chen, Shih-Cheng; Chen, Te-Chih; Jian, Fu-Yen |
Showing items 16-32 of 32 (1 Page(s) Totally)
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