|
"jian fu yen"的相關文件
顯示項目 26-32 / 32 (共2頁) << < 1 2 每頁顯示[10|25|50]項目
| 國立交通大學 |
2014-12-08T15:07:50Z |
Analysis of Anomalous Capacitance Induced by TAGIDL in p-Channel LTPS TFTs
|
Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Li, Hung-Wei; Chen, Shih-Ching; Jian, Fu-Yen; Chuang, Ying-Shao; Chen, Te-Chih; Chen, Yu-Chun; Tai, Ya-Hsiang |
| 國立成功大學 |
2014-06 |
Temperature-Dependent Instability of Bias Stress in InGaZnO Thin-Film Transistors
|
Chang, Geng-Wei; Chang, Ting-Chang; Jhu, Jhe-Ciou; Tsai, Tsung-Ming; Chang, Kuan-Chang; Syu, Yong-En; Tai, Ya-Hsiang; Jian, Fu-Yen; Hung, Ya-Chi |
| 國立成功大學 |
2013-09 |
Analyzing the effects of ambient dependence for InGaZnO TFTs under illuminated bias stress
|
Chen, Te-Chih; Chang, Ting-Chang; Hsieh, Tien-Yu; Tsai, Ming-Yen; Tsai, Chih-Tsung; Chen, Shih-Ching; Lin, Chia-Sheng; Jian, Fu-Yen |
| 國立成功大學 |
2013-09 |
Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments
|
Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen; Lin, Chia-Sheng; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2013-02-01 |
Investigating bipolar resistive switching characteristics in filament type and interface type BON-based resistive switching memory
|
Tseng, Hsueh-Chih; Chang, Ting-Chang; Cheng, Kai-Hung; Huang, Jheng-Jie; Chen, Yu-Ting; Jian, Fu-Yen; Sze, Simon M.; Tsai, Ming-Jinn; Chu, Ann-Kuo; Wang, Ying-Lang |
| 國立成功大學 |
2012-05-28 |
The asymmetrical degradation behavior on drain bias stress under illumination for InGaZnO thin film transistors
|
Huang, Sheng-Yao; Chang, Ting-Chang; Lin, Li-Wei; Yang, Man-Chun; Chen, Min-Chen; Jhu, Jhe-Ciou; Jian, Fu-Yen |
| 國立成功大學 |
2012 |
Thermal Effect on the Gate-Drain Bias Stress for Amorphous InGaZnO Thin Film Transistors
|
Huang, Sheng-Yao; Chang, Ting-Chang; Chen, Min-Chen; Chen, Shih-Cheng; Chen, Te-Chih; Jian, Fu-Yen |
顯示項目 26-32 / 32 (共2頁) << < 1 2 每頁顯示[10|25|50]項目
|