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"jian fu yen"的相关文件
显示项目 6-15 / 32 (共4页)
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| 國立交通大學 |
2014-12-08T15:33:46Z |
Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen; Lin, Chia-Sheng; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立交通大學 |
2014-12-08T15:33:45Z |
Improvement in the bias stability of amorphous InGaZnO TFTs using an Al2O3 passivation layer
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Huang, Sheng-Yao; Chang, Ting-Chang; Chen, Min-Chen; Chen, Te-Chih; Jian, Fu-Yen; Chen, Yu-Chun; Huang, Hui-Chun; Gan, Der-Shin |
| 國立交通大學 |
2014-12-08T15:33:45Z |
N2O plasma treatment suppressed temperature-dependent sub-threshold leakage current of amorphous indium-gallium-zinc-oxide thin film transistors
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Chang, Geng-Wei; Chang, Ting-Chang; Jhu, Jhe-Ciou; Tsai, Tsung-Ming; Syu, Yong-En; Chang, Kuan-Chang; Jian, Fu-Yen; Hung, Ya-Chi; Tai, Ya-Hsiang |
| 國立交通大學 |
2014-12-08T15:31:03Z |
NBTI Degradation in LTPS TFTs Under Mechanical Tensile Strain
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Lin, Chia-Sheng; Chen, Ying-Chung; Chang, Ting-Chang; Jian, Fu-Yen; Hsu, Wei-Che; Kuo, Yuan-Jui; Dai, Chih-Hao; Chen, Te-Chih; Lo, Wen-Hung; Hsieh, Tien-Yu; Shih, Jou-Miao |
| 國立交通大學 |
2014-12-08T15:31:00Z |
On the Origin of Gate-Induced Floating-Body Effect in PD SOI p-MOSFETs
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Dai, Chih-Hao; Chang, Ting-Chang; Chu, An-Kuo; Kuo, Yuan-Jui; Jian, Fu-Yen; Lo, Wen-Hung; Ho, Szu-Han; Chen, Ching-En; Chung, Wan-Lin; Shih, Jou-Miao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng-Tung |
| 國立交通大學 |
2014-12-08T15:30:12Z |
Investigating the degradation behavior caused by charge trapping effect under DC and AC gate-bias stress for InGaZnO thin film transistor
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Chen, Te-Chih; Chang, Ting-Chang; Hsieh, Tien-Yu; Lu, Wei-Siang; Jian, Fu-Yen; Tsai, Chih-Tsung; Huang, Sheng-Yao; Lin, Chia-Sheng |
| 國立交通大學 |
2014-12-08T15:29:55Z |
Investigating bipolar resistive switching characteristics in filament type and interface type BON-based resistive switching memory
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Tseng, Hsueh-Chih; Chang, Ting-Chang; Cheng, Kai-Hung; Huang, Jheng-Jie; Chen, Yu-Ting; Jian, Fu-Yen; Sze, Simon M.; Tsai, Ming-Jinn; Chu, Ann-Kuo; Wang, Ying-Lang |
| 國立交通大學 |
2014-12-08T15:28:51Z |
On-Current Decrease After Erasing Operation in the Nonvolatile Memory Device With LDD Structure
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Chang, Geng-Wei; Chang, Ting-Chang; Syu, Yong-En; Tai, Ya-Hsiang; Jian, Fu-Yen |
| 國立交通大學 |
2014-12-08T15:26:31Z |
Effect of Lateral Body Terminal on Silicon-Oxide-Nitride-Oxide-Silicon Thin-Film Transistors
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Li, Hung-Wei; Chang, Ting-Chang; Chang, Geng-Wei; Lin, Chia-Sheng; Tsai, Tsung-Ming; Jian, Fu-Yen; Tai, Ya-Hsiang; Lee, Ming-Hsien |
| 國立交通大學 |
2014-12-08T15:22:46Z |
Abnormal Subthreshold Leakage Current at High Temperature in InGaZnO Thin-Film Transistors
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Chang, Geng-Wei; Chang, Ting-Chang; Jhu, Jhe-Ciou; Tsai, Tsung-Ming; Syu, Yong-En; Chang, Kuan-Chang; Tai, Ya-Hsiang; Jian, Fu-Yen; Hung, Ya-Chi |
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