臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
國立成功大學	2021-05	Investigation of Degradation Behavior During Illuminated Negative Bias Temperature Stress in P-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors	Wang;Yu-Xuan;Chang;Ting-Chang;Tai;Mao-Chou;Wu;Chia-Chuan;Tu;Yu-Fa;Chen;Jian-Jie;Huang;Wei-Chen;Shih;Yu-Shan;Chen;Yu-An;Huang;Jen-Wei;Sze;Simon
國立成功大學	2020-08	Hydrogen Diffusion and Threshold Voltage Shifts in Top-Gate Amorphous InGaZnO Thin-Film Transistors	Chen;Hong-Chih;Chen;Jian-Jie;Zhou;Kuan-Ju;Chen;Guan-Fu;Kuo;Chuan-Wei;Shih;Yu-Shan;Su;Wan-Ching;Yang;Chih-Cheng;Huang;Hui-Chun;Shih;Chih-Cheng;Lai;Wei-Chih;Chang;Ting-Chang
國立成功大學	2020-07	Investigation and Compact Modeling of Hot-Carrier Injection for Read Disturbance in 3-D NAND Flash Memory	Chen;Hong-Chih;Chen;Jian-Jie;Tu;Yu-Fa;Zhou;Kuan-Ju;Kuo;Chuan-Wei;Su;Wan-Ching;Hung;Yang-Hao;Shih;Yu-Shan;Huang;Hui-Chun;Tsai;Tsung-Ming;Huang;Jen-Wei;Lai;Wei-Chih;Chang;Ting-Chang
國立成功大學	2020-03	Impact of Gate Size on Abnormal Current Rise Under an Electric Field in Organic Thin-Film Transistors	Chen;Hong-Chih;Chen;Guan-Fu;Chen;Jian-Jie;Kuo;Chuan-Wei;Zhou;Kuan-Ju;Tu;Yu-Fa;Lu;I-Nien;Shih;Yu-Shan;Sun;Li-Chuan;Huang;Hui-Chun;Wu;Wen-Chi;Lai;Wei-Chih;Chang;Ting-Chang
國立成功大學	2019-12	Formation of Hump Effect Due to Top-Gate Bias Stress in Organic Thin-Film Transistors	Chen;Hong-Chih;Chen;Guan-Fu;Huang;Shin-Ping;Chang;Ting-Chang;Chen;Po-Hsun;Chen;Jian-Jie;Kuo;Chuan-Wei;Zhou;Kuan-Ju;Hung;Yang-Hao;Tsao;Yu-Ching;Chu;An-Kuo;Huang;Hui-Chun;Lai;Wei-Chih
國立成功大學	2019-10-30	Investigation of the Capacitance-Voltage Electrical Characteristics of Thin-Film Transistors Caused by Hydrogen Diffusion under Negative Bias Stress in a Moist Environment	Chen;Hong-Chih;Kuo;Chuan-Wei;Chang;Ting-Chang;Lai;Wei-Chih;Chen;Po-Hsun;Chen;Guan-Fu;Huang;Shin-Ping;Chen;Jian-Jie;Zhou;Kuan-Ju;Shih;Chih-Cheng;Tsao;Yu-Ching;Huang;Hui-Chun;Sze;Simon, M.
國立成功大學	2019-09	A Novel Heat Dissipation Structure for Inhibiting Hydrogen Diffusion in Top-Gate a-InGaZnO TFTs	Chen;Hong-Chih;Chen;Guan-Fu;Chen;Po-Hsun;Huang;Shin-Ping;Chen;Jian-Jie;Zhou;Kuan-Ju;Kuo;Chuan-Wei;Tsao;Yu-Ching;Chu;An-Kuo;Huang;Hui-Chun;Lai;Wei-Chih;Chang;Ting-Chang
國立成功大學	2019-08	Abnormal Unsaturated Output Characteristics In a-InGaZnO TFTs With Light Shielding Layer	Chen;Hong-Chih;Zhou;Kuan-Ju;Chen;Po-Hsun;Chen;Guan-Fu;Huang;Shin-Ping;Chen;Jian-Jie;Kuo;Chuan-Wei;Tsao;Yu-Ching;Tai;Mao-Chou;Chu;An-Kuo;Lai;Wei-Chih;Chang;Ting-Chang
國立成功大學	2019-06	An Energy-Band Model for Dual-Gate-Voltage Sweeping in Hydrogenated Amorphous Silicon Thin-Film Transistors	Chen;Guan-Fu;Chen;Hong-Chih;Chang;Ting-Chang;Huang;Shin-Ping;Chen;Hua-Mao;Liao;Po-Yung;Chen;Jian-Jie;Kuo;Chuan-Wei;Lai;Wei-Chih;Chu;Ann-Kuo;Lin;Sung-Chun;Yeh;Cheng-Yen;Chang;Chia-Sen;Tsai;Cheng-Ming;Yu;Ming-Chang;Zhang;Shengdong
國立成功大學	2018-10-22	Floating top gate-induced output enhancement of a-InGaZnO thin film transistors under single gate operations	Tai;Mao-Chou;Chang;Ting-Chang;Chen;Ming-Chen;Chian;Hsiao-Cheng;Tsao;Yu-Ching;Chien;Yu-Chieh;Wang;Yu-Xuan;Tsai;Yu-Lin;Chen;Jian-Jie;Zhang;Shengdong;Chang;Hsi-Ming
國立臺灣海洋大學	2014	邊界元素法與邊界積分方程法中退化尺度正規化之研究	Jian, Jie; 簡頡

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