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Institution Date Title Author
國立交通大學 2014-12-08T15:26:45Z Whole-chip ESD protection strategy for CMOS integrated circuits in nanotechnology Ker, MD; Jiang, HC
國立交通大學 2014-12-08T15:26:38Z Latchup current self-stop circuit for whole-chip latchup prevention in bulk CMOS integrated circuits Peng, JJ; Ker, MD; Jiang, HC
國立交通大學 2014-12-08T15:26:36Z Design of negative charge pump circuit with polysilicon diodes in a 0.25-mu m CMOS process Ker, MD; Chang, CY; Jiang, HC
國立交通大學 2014-12-08T15:26:28Z Failure analysis of ESD damage in a high-voltage driver IC and the effective ESD protection solution Ker, MD; Peng, JJ; Jiang, HC
國立交通大學 2014-12-08T15:26:13Z Test structure and verification on the MOSFET under bond pad for area-efficient I/O layout in high-pin-count SOCIC's Ker, MD; Peng, JJ; Jiang, HC

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