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Institution	Date	Title	Author
元智大學	2014-03-28	Automatic visual inspection of solar wafers using mean-shift techniques	Du-Ming Tsai; Wei-Yao Chiu; Jie-Yu Luo
元智大學	2011-02	Mean shift-based defect detection in multicrystalline solar wafer surfaces	Du-Ming Tsai; Jie-Yu Luo

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