臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
國立臺灣大學	1989	Minority-Carrier Lifetime Measurement Using an Al/SiO2/p-Si MOS Capacitor	林浩雄; Jih, H. J.; Lin, Hao-Hsiung; Jih, H. J.
臺大學術典藏	1989	Minority-Carrier Lifetime Measurement Using an Al/SiO2/p-Si MOS Capacitor	Lin, Hao-Hsiung; Jih, H. J.; 林浩雄; Jih, H. J.; Lin, Hao-Hsiung; Jih, H. J.

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