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"jin y"的相关文件
显示项目 106-130 / 137 (共6页)
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| 臺大學術典藏 |
2019-09-09T00:40:58Z |
First measurements of absolute branching fractions of the Ξc 0 Baryon at Belle
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Libby, J.; Iwasaki, Y.; Li Gioi, L.; Mizuk, R.; Chilikin, K.; Yuan, C. Z.; Bondar, A.; Garmash, A.; Matsuda, T.; Bra?ko, M.; Di Carlo, S.; Inami, K.; Kim, D. Y.; Kinoshita, K.; Dong, T. V.; Kody?, P.; Al Said, S.; Kwon, Y. J.; Nakano, E.; Masuda, M.; Krokovny, P.; Shen, C. P.; Mussa, R.; Fulsom, B. G.; Nakao, M.; Lee, S. C.; Cunliffe, S.; Merola, M.; Asner, D. M.; Bansal, V.; Badhrees, I.; Jin, Y.; Iijima, T.; Niiyama, M.; Cao, L.; Kroeger, R.; Cheon, B. G.; Drasal, Z.; Chen, A.; Beleno, C.; Kumita, T.; Itoh, R.; Bhuyan, B.; Ishikawa, A.; Iwasaki, M.; Inguglia, G.; Kuzmin, A.; Choi, Y.; Cho, K.; Macnaughton, J.; Gabyshev, N.; Hayasaka, K.; Li, L. K.; Berger, M.; Bozek, A.; Nayak, M.; ?ervenkov, D.; Kim, S. H.; Lee, J. Y.; Miyabayashi, K.; Ban, Y.; Cinabro, D.; Cinabro, D.;Ban, Y.;Miyabayashi, K.;Lee, J. Y.;Kim, S. H.;Červenkov, D.;Nayak, M.;Bozek, A.;Berger, M.;Li, L. K.;Hayasaka, K.;Gabyshev, N.;Macnaughton, J.;Cho, K.;Choi, Y.;Kuzmin, A.;Inguglia, G.;Iwasaki, M.;Ishikawa, A.;Bhuyan, B.;Itoh, R.;Kumita, T.;Belenõ, C.;CHIA-LIN HSU;Fast, J. E.;Miyata, H.;Chen, A.;Drásal, Z.;Cheon, B. G.;Kroeger, R.;Cao, L.;Niiyama, M.;Iijima, T.;Jin, Y.;Badhrees, I.;Bansal, V.;Asner, D. M.;Merola, M.;Cunliffe, S.;Choi, S. K.;Kim, H. J.;Li, Y. B.;Goldenzweig, P.;Garg, R.;Jia, S.;Lubej, M.;Liventsev, D.;Adachi, I.;Ayad, R.;Aihara, H.;Hayashii, H.;Mohanty, G. B.;Kim, K. T.;Bilka, T.;Biswal, J.;Giri, A.;Greenwald, D.;Joffe, D.;Karyan, G.;Kichimi, H.;Nath, K. J.;Joo, K. K.;Jacobs, W. W.;Bhardwaj, V.;Aushev, T.;Kotchetkov, D.;Kim, J. B.;Eidelman, S.;KriŽan, P.;Kawasaki, T.;Lee, S. C.;Nakao, M.;Fulsom, B. G.;Mussa, R.;Shen, C. P.;Krokovny, P.;Masuda, M.;Nakano, E.;Kwon, Y. J.;Al Said, S.;Kodyš, P.;Dong, T. V.;Kinoshita, K.;Kim, D. Y.;Inami, K.;Di Carlo, S.;Bračko, M.;Matsuda, T.;Garmash, A.;Bondar, A.;Yuan, C. Z.;Chilikin, K.;Mizuk, R.;Li Gioi, L.;Iwasaki, Y.;Libby, J.;DoleŽal, Z.;Grube, B.;Korpar, S.;Gaur, V.; Gaur, V.; Korpar, S.; Grube, B.; Dole?al, Z. |
| 臺大學術典藏 |
2019-09-09T00:40:57Z |
Search for the B →y (4260)K, y (4260) →j /ψπ+π- decays
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Kotchetkov, D.;Asner, D. M.;Lange, J. S.;Bozek, A.;Jia, S.;Julius, T.;Kwon, Y. J.;Kim, D. Y.;Kinoshita, K.;Haba, J.;Matvienko, D.;Kaliyar, A. B.;Kim, J. B.;Di Carlo, S.;Fast, J. E.;Jeon, H. B.;Inguglia, G.;Liventsev, D.;Kuhr, T.;Li Gioi, L.;Iwasaki, Y.;Hayashii, H.;Garmash, A.;Biswal, J.;Luo, T.;Li, Y. B.;Grzymkowska, O.;Chen, A.;Korpar, S.;Fulsom, B. G.;Choi, Y.;Kim, S. H.;Macnaughton, J.;Kodyš, P.;Kumar, R.;Hou, W. S.;Dash, N.;Aulchenko, V.;Krokovny, P.;Iwasaki, M.;Li, L. K.;Golob, B.;Chilikin, K.;Miyabayashi, K.;Gaur, V.;Garg, R.;CHIA-LIN HSU;Drásal, Z.;Joffe, D.;Ayad, R.;Inami, K.;Li, C. H.;Mori, T.;Bobrov, A.;Aihara, H.;KriŽan, P.;Al Said, S.;Lee, J. K.;Ishikawa, A.;Jacobs, W. W.;Bhardwaj, V.;Cao, L.;Jin, Y.;Červenkov, D.;Lee, S. C.;Dong, T. V.;Choi, S. K.;Cunliffe, S.;Cheon, B. G.;Hayasaka, K.;DoleŽal, Z.;Joo, K. K.;Giri, A.;Gabyshev, N.;Ahn, J. K.;Eidelman, S.;Kawasaki, T.;Bilka, T.;Beleño, C.;PI-CHING LU;Cho, H. E.;Mizuk, R.;Bahinipati, S.;Singh, J. B.;Libby, J.;Kichimi, H.;Itoh, R.;Babu, V.;Bansal, V.;Bračko, M.;Merola, M.;Aushev, T.;Adachi, I.;Kroeger, R.;Masuda, M.;Matsuda, T.;Cho, K.;Mohanty, G. B.;Cinabro, D.;Miyata, H.; Miyata, H.; Cinabro, D.; Mohanty, G. B.; Cho, K.; Matsuda, T.; Masuda, M.; Kroeger, R.; Adachi, I.; Aushev, T.; Merola, M.; Bra?ko, M.; Bansal, V.; Li, L. K.; Iwasaki, M.; Krokovny, P.; Aulchenko, V.; Dash, N.; Hou, W. S.; Kumar, R.; Kody?, P.; Macnaughton, J.; Kim, S. H.; Choi, Y.; Fulsom, B. G.; Korpar, S.; Chen, A.; Grzymkowska, O.; Li, Y. B.; Luo, T.; Biswal, J.; Garmash, A.; Hayashii, H.; Iwasaki, Y.; Li Gioi, L.; Kuhr, T.; Liventsev, D.; Inguglia, G.; Jeon, H. B.; Fast, J. E.; Di Carlo, S.; Kim, J. B.; Kaliyar, A. B.; Matvienko, D.; Haba, J.; Kinoshita, K.; Kim, D. Y.; Kwon, Y. J.; Julius, T.; Jia, S.; Bozek, A.; Lange, J. S.; Asner, D. M.; Kotchetkov, D.; Babu, V.; Itoh, R.; Kichimi, H.; Libby, J.; Singh, J. B.; Bahinipati, S.; Mizuk, R.; Cho, H. E.; PI-CHING LU; Beleno, C.; Bilka, T.; Kawasaki, T.; Eidelman, S.; Ahn, J. K.; Gabyshev, N.; Giri, A.; Joo, K. K.; Dole?al, Z.; Hayasaka, K.; Cheon, B. G.; Cunliffe, S.; Choi, S. K.; Dong, T. V.; Lee, S. C.; Garg, R.; Gaur, V.; Miyabayashi, K.; Chilikin, K.; Golob, B. |
| 臺大學術典藏 |
2019-07-10 |
Measurement of branching fraction and final-state asymmetry for the B 0 ? KS0 K p± Decay measurement of branching fraction and final-state ... Y.-T. LAI et al
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Iijima, T.;Di Carlo, S.;Choudhury, S.;Kodyš, P.;Bansal, V.;Lee, I. S.;Kim, D. Y.;Iwasaki, M.;Chen, A.;Iwasaki, Y.;Kinoshita, K.;Korpar, S.;Cheon, B. G.;Kuzmin, A.;Jia, S.;Haba, J.;Aihara, H.;Li, Y. B.;Gaur, V.;Kiesling, C.;Cho, K.;Bakich, A. M.;Hou, W. S.;Behera, P.;Kaliyar, A. B.;Aushev, T.;Goldenzweig, P.;Chang, P.;Chekelian, V.;Fast, J. E.;Li Gioi, L.;CHIA-LIN HSU;Inami, K.;DoleŽal, Z.;Guan, Y.;Hayasaka, K.;Badhrees, I.;Dong, T. V.;Kumar, R.;Cervenkov, D.;Lee, S. C.;Babu, V.;Kim, J. B.;Garg, R.;Frey, A.;Bracko, M.;Kim, H. J.;Kichimi, H.;Inguglia, G.;Huang, K.;Ishikawa, A.;Dash, N.;Atmacan, H.;Eidelman, S.;Cinabro, D.;Joffe, D.;Hara, T.;Krokovny, P.;Asner, D. M.;Choi, S. K.;Bozek, A.;Greenwald, D.;Adachi, I.;Bobrov, A.;Li, L. K.;Kawasaki, T.;Chilikin, K.;Cao, L.;Al Said, S.;Fulsom, B. G.;Kuhr, T.;Epifanov, D.;Yen-Ting Lai;Lange, J. S.;Bilka, T.;Gelb, M.;Jin, Y.;Kim, S. H.;Beleño, C.;Itoh, R.;Garmash, A.;Kulasiri, R.;Lee, J. K.;Aulchenko, V.;Biswal, J.;Hayashii, H.;KriŽan, P.;Choi, Y.;Karyan, G.;Lee, J. Y.;Kroeger, R.;Kotchetkov, D.;Kwon, Y. J.;Bhuyan, B.;Gabyshev, N.;Lalwani, K.;Li, C. H.;Giri, A.;Cunliffe, S.; Cunliffe, S.; Giri, A.; Li, C. H.; Lalwani, K.; Gabyshev, N.; Bhuyan, B.; Kwon, Y. J.; Kotchetkov, D.; Kroeger, R.; Lee, J. Y.; Karyan, G.; Choi, Y.; Kri?an, P.; Hayashii, H.; Biswal, J.; Aulchenko, V.; Lee, J. K.; Kulasiri, R.; Garmash, A.; Itoh, R.; Beleno, C.; Kim, S. H.; Jin, Y.; Gelb, M.; Bilka, T.; Lange, J. S.; Yen-Ting Lai; Epifanov, D.; Kuhr, T.; Fulsom, B. G.; Al Said, S.; Cao, L.; Chilikin, K.; Kawasaki, T.; Li, L. K.; Bobrov, A.; Adachi, I.; Greenwald, D.; Bozek, A.; Choi, S. K.; Asner, D. M.; Krokovny, P.; Hara, T.; Joffe, D.; Cinabro, D.; Eidelman, S.; Atmacan, H.; Dash, N.; Ishikawa, A.; Huang, K.; Li Gioi, L.; Fast, J. E.; Chekelian, V.; PAO-TI CHANG et al.; Chang, P.; Bansal, V.; Kody?, P.; Choudhury, S.; Di Carlo, S.; Iijima, T. |
| 國立交通大學 |
2019-04-02T06:00:18Z |
Effects of base oxide thickness and silicon composition on charge trapping in HfSiO/SiO2 high-k gate stacks
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Wu, WH; Chen, MC; Tsui, BY; How, YT; Yao, LG; Jin, Y; Tao, HJ; Chen, SC; Liang, MS |
| 臺大學術典藏 |
2018-10-01 |
Search for the lepton-flavor-violating decay B 0 → K *0 μ ± e ∓
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KriŽan, P.;Cunliffe, S.;CHIA-LIN HSU;Chilikin, K.;Aulchenko, V.;Itoh, R.;Guan, Y.;Bansal, V.;Kinoshita, K.;Bhardwaj, V.;Kiesling, C.;Garg, R.;Kawasaki, T.;Golob, B.;Chekelian, V.;Behera, P.;DoleŽal, Z.;Červenkov, D.;Kuhr, T.;Kulasiri, R.;Jia, S.;Atmacan, H.;Kroeger, R.;Badhrees, I.;Kim, D. Y.;Biswal, J.;Joffe, D.;Schwartz, A. J.;Kim, S. H.;Cinabro, D.;Browder, T. E.;Kotchetkov, D.;Al Said, S.;Aihara, H.;Cao, L.;Babu, V.;Iwasaki, Y.;Iijima, T.;Inami, K.;Hayashii, H.;Joo, K. K.;Bozek, A.;Di Carlo, S.;Iwasaki, M.;Goldenzweig, P.;Sandilya, S.;Hara, T.;Haba, J.;Dingfelder, J.;Ayad, R.;Choi, S. K.;Kichimi, H.;Inguglia, G.;Choudhury, S.;Jeon, H. B.;Cho, K.;Dong, T. V.;Gabyshev, N.;Chen, A.;Epifanov, D.;Hou, W. S.;Greenwald, D.;Gelb, M.;Bobrov, A.;Gaur, V.;Korpar, S.;Ishikawa, A.;Hirose, S.;Bračko, M.;Adachi, I.;Ferber, T.;Aushev, T.;Julius, T.;Eidelman, S.;Jacobs, W. W.;Garmash, A.;Kim, J. B.;Bilka, T.;Jaegle, I.;Cheon, B. G.;Choi, Y.;Dash, N.;Giri, A.;Kim, K. T.;Fulsom, B. G.;Kaliyar, A. B.;Bakich, A. M.;Jin, Y.;Fast, J. E.;Beleño, C.;Bahinipati, S.;Kodyš, P.;Drásal, Z.;Chang, P.;Asner, D. M.;Bhuyan, B.;Krokovny, P.;Hayasaka, K.;Trabelsi, K.;Kang, K. H.; Kang, K. H.; Trabelsi, K.; Hayasaka, K.; Krokovny, P.; Bhuyan, B.; Asner, D. M.; Chang, P.; Ayad, R.; Dingfelder, J.; Haba, J.; Hara, T.; Sandilya, S.; Goldenzweig, P.; Iwasaki, M.; Di Carlo, S.; Bozek, A.; Joo, K. K.; Hayashii, H.; Inami, K.; Iijima, T.; Iwasaki, Y.; Babu, V.; Cao, L.; Aihara, H.; Al Said, S.; Kotchetkov, D.; Browder, T. E.; Cinabro, D.; Kim, S. H.; Schwartz, A. J.; Joffe, D.; Biswal, J.; Kim, D. Y.; Badhrees, I.; Kroeger, R.; Atmacan, H.; Jia, S.; Cunliffe, S.; Kri?an, P.; PAO-TI CHANG et al. |
| 臺大學術典藏 |
2018-09-10T09:47:57Z |
An unsupervised learning model to perform side channel attack
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Chou, J.-W.;Chu, M.-H.;Tsai, Y.-L.;Jin, Y.;Cheng, C.-M.;Lin, S.-D.; Chou, J.-W.; Chu, M.-H.; Tsai, Y.-L.; Jin, Y.; Cheng, C.-M.; Lin, S.-D.; CHEN-MOU CHENG; SHOU-DE LIN |
| 臺大學術典藏 |
2018-09-10T09:44:26Z |
Facile fabrication of dextran-based fluorescent nanogels as potential glucose sensors
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Zhou, S.; Min, X.; Dou, H.; Sun, K.; Chen, C.-Y.; Chen, C.-T.; Zhang, Z.; Jin, Y.; Shen, Z.; Zhou, S.; Min, X.; Dou, H.; Sun, K.; Chen, C.-Y.; Chen, C.-T.; Zhang, Z.; Jin, Y.; Shen, Z.; CHAO-TSEN CHEN |
| 國立成功大學 |
2018 |
Conductive tail-to-tail domain walls in epitaxial BiFeO3 films
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Jin, Y.;Xiao, S.;Yang, J.-C.;Zhang, J.;Lu, X.;Chu, Y.-H.;Cheong, S.-W.;Li, J.;Kan, Y.;Yue, C.;Li, Y.;Ju, C.;Huang, F.;Zhu, J. |
| 國立交通大學 |
2017-04-21T06:48:24Z |
High temperature stable [Ir3Si-TaN]/HfLaON CMOS with large work-function difference
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Wu, C. H.; Hung, B. F.; Chin, Albert; Wang, S. J.; Chen, W. J.; Wang, X. P.; Li, M. -F.; Zhu, C.; Jin, Y.; Tao, H. J.; Chen, S. C.; Liang, M. S. |
| 國立成功大學 |
2017 |
Rewritable ferroelectric vortex pairs in BiFeO3
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Li, Y.;Jin, Y.;Lu, X.;Yang, J.-C.;Chu, Y.-H.;Huang, F.;Zhu, J.;Cheong, S.-W. |
| 國家衛生研究院 |
2016-10-08 |
Global, regional, national, and selected subnational levels of stillbirths, neonatal, infant, and under-5 mortality, 1980–2015: A systematic analysis for the Global Burden of Disease Study 2015
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Wang, H;Coates, MM;Coggeshall, M;Dandona, L;Fraser, M;Fullman, N;Hay, SI;Huynh, C;Kulikoff, XR;Kutz, MJ;Larson, HJ;Lim, SS;Lind, M;Lopez, AD;Mikesell, JB;Mokdad, AH;Mooney, MD;Naghavi, M;Nguyen, G;Silpakit, N;Sligar, A;Sorensen, RJD;Vos, T;Achoki, T;Anderson, GM;Barber, RM;Blore, JD;Brown, A;Carter, A;Casey, DC;Cercy, K;Cornaby, L;Friedman, J;Haagsma, JA;Hancock, J;Khalil, IA;Kyu, HH;Liu, PY;Masiye, F;Mirarefin, M;Misganaw, A;Moradi-Lakeh, M;Ng, M;Rao, P;Reynolds, A;Roth, GA;Troeger, C;Vollset, SE;Zhou, M;Murray, CJL;Mock, CN;Harun, KM;Bhutta, ZA;Nisar, MI;Akseer, N;deVeber, GA;Jeemon, P;Dandona, R;Kumar, GA;Diallo, K;Rakovac, I;Franca, EB;Hay, SI;Gething, PW;Bisanzio, D;Deribew, A;Cooper, C;Ali, R;Bennett, DA;Jha, V;Murphy, GAV;Weiss, DJ;Kinfu, Y;Kawakami, N;Kita, M;Shibuya, K;Liang, J;Duan, L;Jin, Y;Li, Y;Liu, S;Wang, L;Ye, P;Liang, X;Alam, K;Colquhoun, SM;Weintraub, RG;Meretoja, A;Szoeke, CEI;Wijeratne, T;Lozano, R;Campos-Nonato, IR;Campuzano, JC;Gomez-Dantes, H;Heredia-Pi, IB;et al. |
| 亞洲大學 |
2016-05 |
Illustrations of Chinese tourism research
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Ryan, C.;Ryan, C.;*;Sun, M.;Sun, M.;Zhang, X.;Zhang, X.;Li, F.;Li, F.;Li, P.;Li, P.;Gao, J.;Gao, J.;Jin, Y.;Jin, Y.;林宜欣;Lin, Yi-Hsin |
| 中國醫藥大學 |
2015-11 |
FOXC1 Activates Smoothened-Independent Hedgehog Signaling in Basal-like Breast Cancer
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(Han, B.);(Qu, Y.);(Jin, Y.);(Yu, Y.);(Deng, N.);(Wawrowsky, K.);(Zhang, X.);(Li, N.);(Bose, S.);(Wang, Q.);(Sakkiah, S.);(Abrol, R.);(Jensen, T. W.);(Berman, B. P.);(Tanaka, H.);(Johnson, J.);(Gao, B.);(Hao, J.);(Liu, Z.);(Buttyan, R.);(Ray, P. S.);洪明奇(Mien-Chie Hung);(Giuliano, A. E.);(Cui, X.)* |
| 國立成功大學 |
2014-12-25 |
Microstructure and magnetism of hydrothermal synthesized Mn-doped ZnTe nanoparticles
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Tang, F. L.; Su, H. L.; Huang, S. Y.; Wu, Y. C.; Huang, J. C. A.; Du, Y. W.; Huang, X. L.; Jin, Y. |
| 國立交通大學 |
2014-12-08T15:25:51Z |
The impact of STI induced reliabilities for scaled p-MOSFET in an advanced multiple oxide CMOS technology
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Chung, SS; Yeh, CH; Feng, SJ; Lai, CS; Yang, JJ; Chen, CC; Jin, Y; Chen, SC; Liang, MS |
| 國立交通大學 |
2014-12-08T15:25:43Z |
Effects of base oxide in HfSiO/SiO2 high-k gate stacks
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Wu, WH; Chen, MC; Wang, MF; Hou, TH; Yao, LG; Jin, Y; Chen, SC; Liang, MS |
| 國立交通大學 |
2014-12-08T15:18:40Z |
Effects of base oxide thickness and silicon composition on charge trapping in HfSiO/SiO(2) high-k gate stacks
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Wu, WH; Chen, MC; Tsui, BY; How, YT; Yao, LG; Jin, Y; Tao, HJ; Chen, SC; Liang, MS |
| 國立交通大學 |
2014-12-08T15:17:09Z |
Impact of STI on the reliability of narrow-width pMOSFETs with advanced ALD N/O gate stack
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Chung, SS; Yeh, CH; Feng, HJ; Lai, CS; Yang, JJ; Chen, CC; Jin, Y; Chen, SC; Liang, MS |
| 國立交通大學 |
2014-12-08T15:16:41Z |
Two-frequency C-V correction using five-element circuit model for high-k gate dielectric and ultrathin oxide
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Wu, WH; Tsui, BY; Huang, YP; Hsieh, FC; Chen, MC; Hou, YT; Jin, Y; Tao, HJ; Chen, SC; Liang, MS |
| 國立交通大學 |
2014-12-08T15:16:30Z |
HfAlON n-MOSFETs incorporating low-work function gate using ytterbium silicide
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Wu, CH; Hung, BF; Chin, A; Wang, SJ; Yen, FY; Hou, YT; Jin, Y; Tao, HJ; Chen, SC; Liang, MS |
| 國立交通大學 |
2014-12-08T15:15:52Z |
HfSiON n-MOSFETs using low-work function HfSi chi gate
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Wu, C. H.; Hung, B. F.; Chin, Albert; Wang, S. J.; Yen, F. Y.; Hou, Y. T.; Jin, Y.; Tao, H. J.; Chen, S. C.; Liang, M. S. |
| 國立交通大學 |
2014-12-08T15:14:46Z |
High-temperature stable IrxSi gates with high work function on HfSiON p-MOSFETs
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Hung, B. F.; Wu, C. H.; Chin, Albert; Wang, S. J.; Yen, F. Y.; Hou, Y. T.; Jin, Y.; Tao, H. J.; Chen, Shih C.; Liang, Mong-Song |
| 國立交通大學 |
2014-12-08T15:14:22Z |
High-temperature stable HfLaON p-MOSFETs with high-work-function Ir3Si gate
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Wu, C. H.; Hung, B. F.; Chin, Albert; Wang, S. J.; Wang, X. P.; Li, M. -F.; Zhu, C.; Yen, F. Y.; Hou, Y. T.; Jin, Y.; Tao, H. J.; Chen, S. C.; Liang, M. S. |
| 國立成功大學 |
2014 |
Dependence of magnetism on the doping level of Zn1-xMnxTe nanoparticles synthesized by a hydrothermal method
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Tang, F. L.; Su, H. L.; Chuang, P. Y.; Wu, Y. C.; Huang, J. C. A.; Huang, X. L.; Jin, Y. |
| 臺北醫學大學 |
2009 |
Mechanism of neuroprotective function of taurine
|
李怡萱; Wu JY; Wu H; Jin Y; Wei J; Sha D; Prentice H; Lee HH; Lin CH; Lee YH; Yang LL |
显示项目 106-130 / 137 (共6页)
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