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"jing m h"
Showing items 1-10 of 16 (2 Page(s) Totally)
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| 義守大學 |
2008/08/20 |
Dynamic scanning method to clarify the mechanism of WLCSP package reliability issue
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Po-Ying Chen ; Chwei-Shyong Tsai ; Ming-Hsiung Tsai ; Heng-Yu Kung ; Shen-Li Chen ; Jing, M.H. ; Wen-Kuan Yeh |
| 義守大學 |
2008/04/27 |
Effect of crystal-originated particles (COPs) on ULSI process integrity
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Po-Ying Chen ; Chen, S.L. ; Tsai, M.H. ; Jing, M.H. ; Lin, T.-C. ; Wen-Kuan Yeh |
| 義守大學 |
2007/12/20 |
Investigation of Electrostatic Charges Trapping during 12-Inch Deep Submicron VLSI Proces
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Po-Ying Chen ; Chen, S.L. ; Tsai, M.H. ; Jing, M.H. ; Lin, T.-C. |
| 義守大學 |
2007/12/20 |
Implement of an Improvement Particle Monitoring Methodology in an Industry Production Process
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Po-Ying Chen ; Chen, S.L. ; Tsai, M.H. ; Jing, M.H. ; Lin, T.-C. |
| 義守大學 |
2007/12/20 |
Investigation of Wafer Strength in 12 inch Bare Wafer for Prevent Wafer Breakage
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Po-Ying Chen ; Jing, M.H. ; Tin, T.C. |
| 義守大學 |
2007/07/11 |
The Defects of Silicon Reacted with Carbon Content Vapour in ULSI Nano-meter-Generation Technology
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Po-Ying Chen ; Shen-Li Chen ; Ming-Hsiung Tsai ; Jing, M.H. ; Lin, T.-C. ; Cheng-Chia Kuo |
| 義守大學 |
2007/07/11 |
The Defects of Silicon Reacted with Carbon Content Vapour in ULSI Nano-meter-Generation Technology
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Po-Ying Chen ; Shen-Li Chen ; Ming-Hsiung Tsai ; Jing, M.H. ; Lin, T.-C. ; Cheng-Chia Kuo |
| 義守大學 |
2007/07/11 |
The Failure Mode Investigation of Barrier Layer TaN Combined with Al Pad Architecture using in Cu Process
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Po-Ying Chen ; Shen-Li Chen ; Ming-Hsiung Tsai ; Jing, M.H. ; Lin, T.-C. |
| 義守大學 |
2004/12/06 |
The design of RS decoder with a small core for portable communication
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Jing, M.H. ; Truong, T.K. ; Chen, Y.H. ; Luo, Y.C. |
| 義守大學 |
2004/12/06 |
The SOC design of a highly secure and reliable storage using a conceptual environment
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Jing, M.H. ; Ko, S.Y. ; Wu, W.C. |
Showing items 1-10 of 16 (2 Page(s) Totally)
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