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机构 日期 题名 作者
國立交通大學 2019-04-02T05:58:51Z A study on the radiation hardness of flash cell with horn-shaped floating-gate Huang, TY; Jong, FC; Chao, TS; Lin, HC; Leu, LY; Young, K; Lin, CH; Chiu, KY
國立交通大學 2014-12-08T15:49:20Z Effects of N2O-annealed sacrificial oxide on the short-channel effects of nMOSFETs Jong, FC; Huang, TY; Chao, TS; Lin, HC; Wang, MF; Chang, CY
國立交通大學 2014-12-08T15:48:56Z Improving radiation hardness of EEPROM/flash cell by N2O annealing Huang, TY; Jong, FC; Chao, TS; Lin, HC; Leu, LY; Young, K; Lin, CH; Chiu, KY
國立交通大學 2014-12-08T15:47:03Z The effects of shallow germanium halo doping on N-channel metal oxide semiconductor field effect transistors Wang, MF; Chien, CH; Chao, TS; Lin, HC; Jong, FC; Huang, TY; Chang, CY
國立交通大學 2014-12-08T15:01:42Z Improved flash cell performance by N2O annealing of interpoly oxide Jong, FC; Huang, TY; Chao, TS; Lin, HC; Leu, LY; Young, K; Lin, CH; Chiu, KY
國立交通大學 2014-12-08T15:01:35Z Effects of floating-gate doping concentration on flash cell performance Huang, TY; Jong, FC; Lin, HC; Chao, TS; Leu, LY; Young, K; Lin, CH; Chiu, KY
國立交通大學 2014-12-08T15:01:30Z A study on the radiation hardness of flash cell with horn-shaped floating-gate Huang, TY; Jong, FC; Chao, TS; Lin, HC; Leu, LY; Young, K; Lin, CH; Chiu, KY

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