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Institution Date Title Author
元智大學 Sep-20 Defect Detection in Printed Circuit Boards Using You-Only-Look-Once Convolutional Neural Networks Venkat Anil Adibhatla; Huan-Chuang Chih; Chi-Chang Hsu; Joseph Cheng; Maysam F. Abbod; J.S. Shieh
元智大學 May-21 Applying Deep learning to defect detection in printed circuit boards via a newest model of you-only-look-once Venkat Anil Adibhatla; Huan-Chuang Chih; Chi-Chang Hsu; Joseph Cheng; Maysam F. Abbod; J.S. Shieh
臺大學術典藏 2019-10-31T08:01:00Z Dielectric constant measurement using metallized slot substrate integrated waveguide at PCB process HSIN-CHIA LU;Hsin-Chia Lu;Chung-Hsing Liao;Jason Lee;Joseph Cheng;Yu-Heng Cai;Pei-Tzu Chen; Pei-Tzu Chen; Yu-Heng Cai; Joseph Cheng; Jason Lee; Chung-Hsing Liao; Hsin-Chia Lu; HSIN-CHIA LU
元智大學 2018-10-24 Detecting Defects in PCB using Deep Learning via Convolution Neural Networks Venkat Anil Adibhatla; J.S. Shieh; Maysam F. Abbod; Huan-Chuang Chih; Chi-Chang Hsu; Joseph Cheng

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