| 元智大學 |
Sep-20 |
Defect Detection in Printed Circuit Boards Using You-Only-Look-Once Convolutional Neural Networks
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Venkat Anil Adibhatla; Huan-Chuang Chih; Chi-Chang Hsu; Joseph Cheng; Maysam F. Abbod; J.S. Shieh |
| 元智大學 |
May-21 |
Applying Deep learning to defect detection in printed circuit boards via a newest model of you-only-look-once
|
Venkat Anil Adibhatla; Huan-Chuang Chih; Chi-Chang Hsu; Joseph Cheng; Maysam F. Abbod; J.S. Shieh |
| 臺大學術典藏 |
2019-10-31T08:01:00Z |
Dielectric constant measurement using metallized slot substrate integrated waveguide at PCB process
|
HSIN-CHIA LU;Hsin-Chia Lu;Chung-Hsing Liao;Jason Lee;Joseph Cheng;Yu-Heng Cai;Pei-Tzu Chen; Pei-Tzu Chen; Yu-Heng Cai; Joseph Cheng; Jason Lee; Chung-Hsing Liao; Hsin-Chia Lu; HSIN-CHIA LU |
| 元智大學 |
2018-10-24 |
Detecting Defects in PCB using Deep Learning via Convolution Neural Networks
|
Venkat Anil Adibhatla; J.S. Shieh; Maysam F. Abbod; Huan-Chuang Chih; Chi-Chang Hsu; Joseph Cheng |
