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| 臺大學術典藏 |
2022-06-30T02:06:03Z |
Development of electromagnetic scanning stage for astigmatic profilometer
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Chang B.-C.; Ding R.-F.; Juang B.-J.; Huang K.-Y.; Chang B.-C.; Ding R.-F.; Juang B.-J.; Huang K.-Y.; BIING-CHWEN CHANG |
| 臺大學術典藏 |
2020-01-13T08:21:15Z |
Spring constant calibration of microcantilever by astigmatic detection system
|
Liao, H.-S.; Juang, B.-J.; Huang, K.-Y.; Hwu, E.-T.; Chang, C.-S.; KUANG-YUH HUANG |
| 臺大學術典藏 |
2020-01-13T08:21:15Z |
AFM pickup head with holographic optical element (HOE)
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Juang, B.-J.; Huang, K.-Y.; Liao, H.-S.; Leong, K.-C.; Hwang, I.-S.; KUANG-YUH HUANG |
| 臺大學術典藏 |
2020-01-13T08:21:12Z |
Development of electromagnetic scanning stage for astigmatic profilometer
|
Chang, B.-C.; Ding, R.-F.; Juang, B.-J.; Huang, K.-Y.; KUANG-YUH HUANG |
| 臺大學術典藏 |
2020-01-13T08:20:28Z |
AFM pickup head with holographic optical element (HOE)
|
Juang, B.-J.; Huang, K.-Y.; Liao, H.-S.; Leong, K.-C.; Hwang, I.-S.; HSIEN-SHUN LIAO |
| 臺大學術典藏 |
2020-01-13T08:20:27Z |
Spring constant calibration of microcantilever by astigmatic detection system
|
Liao, H.-S.; Juang, B.-J.; Huang, K.-Y.; Hwu, E.-T.; Chang, C.-S.; HSIEN-SHUN LIAO |
| 國立臺灣大學 |
2011 |
otational positioning system adapted to atomic force microscope for measuring anisotropic surface properties
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Liao, H.-S.; Juang, B.-J.; Chang, W.-C.; Lai, W.-C.; Huang, K.-Y.; Chang, C.-S. |
| 臺大學術典藏 |
2011 |
otational positioning system adapted to atomic force microscope for measuring anisotropic surface properties
|
HuangKY; LiaoHS; Chang, C.-S.; Huang, K.-Y.; Lai, W.-C.; Chang, W.-C.; Juang, B.-J.; Liao, H.-S.; Liao, H.-S.; Juang, B.-J.; Chang, W.-C.; Lai, W.-C.; Huang, K.-Y.; Chang, C.-S. |
Showing items 1-8 of 8 (1 Page(s) Totally)
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