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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
元智大學 Jul-19 Key parameter identification and defective wafer detection of semiconductor manufacturing processes using image processing techniques Shu-Kai S. Fan; Du-Ming Tsai; Fei He; Jui-Yu Huang; Chih-Hung Jen
國立高雄師範大學 2007-06 背景圖像動態化對文字視認性的影響研究 楊清田;黃睿友; Ching-Tien Yang;Jui-Yu Huang

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