臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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机构	日期	题名	作者
臺大學術典藏	2022-05-24T06:26:58Z	A fast center-positioning method for an incomplete hole of PCB from vision	Lee K.-C.;Jywe W.-Y.; Lee K.-C.; Jywe W.-Y.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:56Z	A four-degrees-of-freedom microstage for the compensation of eccentricity of a roundness measurement machine	Liu C.H.;Jywe W.-Y.; Liu C.H.; Jywe W.-Y.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:59Z	A measurement method with virtual gray encoding patterns using window's functions	Fu Y.-F.;Shyu L.-H.;Chen J.-J.;Jywe W.-Y.; Fu Y.-F.; Shyu L.-H.; Chen J.-J.; Jywe W.-Y.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:27:01Z	A method for evaluating the contour and tolerance of the toroidal cutter with helicoidal surfaces	Jywe W.-Y.;Liu C.-H.; Jywe W.-Y.; Liu C.-H.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:52Z	A new concept of optical encoder displacement sensors: Gray encoding patterns and a curve fitting method	Fu Y.F.;Shyu L.H.;Chen Y.T.;Jywe W.Y.;Liu C.H.; Fu Y.F.; Shyu L.H.; Chen Y.T.; Jywe W.Y.; Liu C.H.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:27:00Z	A new measuring apparatus for verifying the CNC machine tools performance using position silicon detector	Jywe W.-Y.;Liu C.-H.; Jywe W.-Y.; Liu C.-H.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:44Z	A novel 5DOF thin coplanar nanometer-scale stage	Jywe W.-Y.;Jeng Y.-R.;Liu C.-H.;Teng Y.-F.;Wu C.-H.;Wang H.-S.;Chen Y.-J.; Jywe W.-Y.; Jeng Y.-R.; Liu C.-H.; Teng Y.-F.; Wu C.-H.; Wang H.-S.; Chen Y.-J.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:57Z	A study of geometric error measurement of cnc machine tools using the improved planar encoder system	Jywe W.-Y.;Liu C.-H.; Jywe W.-Y.; Liu C.-H.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:57Z	A study of the use of the planar encoder system for the geometric error tests of CNC machine tools	Jywe W.-Y.;Shyu L.-H.;Lee K.-C.; Jywe W.-Y.; Shyu L.-H.; Lee K.-C.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:58Z	A tracking measurement method based on the symmetry of surface by using a diffraction laser beam system	Shyu L.-H.;Fu Y.-F.;Jywe W.-Y.;Lee K.-C.;Chen J.-J.; Shyu L.-H.; Fu Y.-F.; Jywe W.-Y.; Lee K.-C.; Chen J.-J.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:52Z	Abbe error-free test equipment for nanometer-order measurements	Wang Y.C.;Manske E.;J?ger G.;Jywe W.Y.; Wang Y.C.; Manske E.; J?ger G.; Jywe W.Y.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:37Z	Active probe control of a metrological Atomic Force Microscopy	Shen J.C.;Dorozhovets N.;Hausotte T.;Manske E.;Jywe W.Y.;Liu C.H.; Shen J.C.; Dorozhovets N.; Hausotte T.; Manske E.; Jywe W.Y.; Liu C.H.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:29Z	An online simultaneous measurement of the dual-axis straightness error for machine tools	Jywe W.-Y.;Hsieh T.-H.;Chen P.-Y.;Wang M.-S.; Jywe W.-Y.; Hsieh T.-H.; Chen P.-Y.; Wang M.-S.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:47Z	An optoelectronic measurement system for measuring 6-degree-of-freedom motion error of rotary parts	Chen C.J.;Lin P.D.;Jywe W.Y.; Chen C.J.; Lin P.D.; Jywe W.Y.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:36Z	Analysis and compensation of geometric error for five-axis CNC machine tools with titling rotary table	Lin M.-T.;Lee Y.-T.;Jywe W.-Y.;Chen Jr. A.; Lin M.-T.; Lee Y.-T.; Jywe W.-Y.; Chen Jr. A.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:53Z	Application of a diffraction grating and position sensitive detectors to the measurement of error motion and angular indexing of an indexing table	Liu C.-H.;Jywe W.-Y.;Shyu L.-H.;Chen C.-J.; Liu C.-H.; Jywe W.-Y.; Shyu L.-H.; Chen C.-J.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:59Z	Application of ball bar system and genetic algorithms for CNC lathe contouring compensation	Jywe W.-Y.;Liu C.-H.; Jywe W.-Y.; Liu C.-H.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:30Z	Application of blue laser direct-writing equipment for manufacturing of periodic and aperiodic nanostructure patterns	Chen P.-Y.;Jywe W.-Y.;Wang M.-S.;Wu C.-H.; Chen P.-Y.; Jywe W.-Y.; Wang M.-S.; Wu C.-H.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:30Z	Automatic calibration system for micro-displacement devices	Shih H.-T.;Wang Y.-C.;Shyu L.-H.;Tung P.-C.;Chang C.-P.;Jywe W.-Y.;Chen J.-H.; Shih H.-T.; Wang Y.-C.; Shyu L.-H.; Tung P.-C.; Chang C.-P.; Jywe W.-Y.; Chen J.-H.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:42Z	Automatic straightness measurement of a linear guide using a real-time straightness self-compensating scanning stage	Liu C.H.;Jeng Y.-R.;Jywe W.Y.;Deng S.-Y.;Hsu T.-H.; Liu C.H.; Jeng Y.-R.; Jywe W.Y.; Deng S.-Y.; Hsu T.-H.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:40Z	Compensation of tilt angles and verification of displacement measurements with a Fabry-Perot interferometer	Wang Y.-C.;Shyu L.-H.;Jywe W.-Y.;Lee B.-Y.; Wang Y.-C.; Shyu L.-H.; Jywe W.-Y.; Lee B.-Y.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:59Z	Constructive geometrical solid of axial-flow fan blade by generated machining method	Lin B.-J.;Hung C.-I.;Lin C.-C.;Jywe W.-Y.; Lin B.-J.; Hung C.-I.; Lin C.-C.; Jywe W.-Y.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:34Z	Control of a high precision positioning stage	Shen J.-C.;Jywe W.-Y.;Lu Q.-Z.;Wu C.-H.; Shen J.-C.; Jywe W.-Y.; Lu Q.-Z.; Wu C.-H.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:35Z	Control of a laser direct writing equipment for manufacturing periodic nano-structure	Shen J.-C.;Jywe W.-Y.;Wu C.-H.; Shen J.-C.; Jywe W.-Y.; Wu C.-H.; Wen-Yuh Jywe
臺大學術典藏	2022-05-24T06:26:32Z	Control of a long-stroke precision scanning stage	Shen J.-C.;Wu C.-H.;Chen B.-Y.;Jywe W.-Y.; Shen J.-C.; Wu C.-H.; Chen B.-Y.; Jywe W.-Y.; Wen-Yuh Jywe

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