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Institution Date Title Author
中原大學 2010-03-08 Contact Behavior of Focused Ion Beam-Deposited Pt on p-type Si Nanowire C.Y.Ho; S,S.Chiu; T.C.Kei; K.T.Tsai; Y.A.Dai; J.H.Hsu; M.L.Chang; and J.H.He,
中原大學 2009-07 Contact Behavier of Focused Ion Beam-Deposited Pt on p-type Si Nanowier C. Y. Ho; S. S. Chiu; T. C. Kei; K. T. Tsai; Y. A. Dai; J. H. Hsu; M. L. Chang; J. H. He
中原大學 2009 Characterization of Focused Ion Beam-Deposited Pt and p-type Si Nanowire Contact S. S. Chiu; C. Y. Ho; T. C. Kei; K. T. Tsai; Y. A. Dai; J. H. Hsu; M. L. Chang; J. H. He
國立中山大學 1996 Dual Modes Near-field Scanning Optical Microscope P.K. Wei; J.H. Hsu; W.S. Fann; K.T. Tsai

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