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Showing items 51-75 of 129 (6 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:27:05Z |
New diode string design with very low leakage current for using in power supply ESD clamp circuits
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Ker, MD; Lo, WY; Chang, HH |
| 國立交通大學 |
2014-12-08T15:26:55Z |
Investigation on ESD robustness of CMOS devices in a 1.8-v 0.15-mu m partially-depleted SOI salicide CMOS technology
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Ker, MD; Hong, KK; Chen, TY; Tang, H; Huang, SC; Chen, SS; Huang, CT; Wang, MC; Loh, YT |
| 國立交通大學 |
2014-12-08T15:26:55Z |
ESD protection strategy for sub-quarter-micron CMOS technology: Gate-driven design versus substrate-triggered design
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Chen, TY; Ker, MD |
| 國立交通大學 |
2014-12-08T15:26:55Z |
Level shifters for high-speed 1-v to 3.3-v interfaces in a 0.13-mu m Cu-Interconnection/Low-k CMOS technology
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Wang, WT; Ker, MD; Chiang, MC; Chen, CH |
| 國立交通大學 |
2014-12-08T15:26:51Z |
Design on ESD protection circuit with very low and constant input capacitance
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Chen, TY; Ker, MD |
| 國立交通大學 |
2014-12-08T15:26:51Z |
Compact layout rule extraction for latchup prevention in a 0.25-mu m shallow-trench-isolation silicided bulk CMOS process
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Ker, MD; Lo, WY; Chen, TY; Tang, H; Chen, SS; Wang, MC |
| 國立交通大學 |
2014-12-08T15:26:50Z |
Automatic methodology for placing the guard rings into chip layout to prevent latchup in CMOS IC's
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Ker, MD; Jiang, HC; Peng, JJ; Shieh, TL |
| 國立交通大學 |
2014-12-08T15:26:50Z |
ESD test methods on integrated circuits: An overview
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Ker, MD; Peng, JH; Jiang, HC |
| 國立交通大學 |
2014-12-08T15:26:45Z |
Whole-chip ESD protection strategy for CMOS integrated circuits in nanotechnology
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Ker, MD; Jiang, HC |
| 國立交通大學 |
2014-12-08T15:26:45Z |
ESD implantations in 0.18-mu m salicided CMOS technology for on-chip ESD protection with layout consideration
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Ker, MD; Chuang, CH |
| 國立交通大學 |
2014-12-08T15:26:45Z |
Novel diode structures and ESD protection circuits in a 1.8-V 0.15-mu m partially-depleted SOI salicided CMOS process
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Ker, MD; Hung, KK; Tang, HTH; Huang, SC; Chen, SS; Wang, MC |
| 國立交通大學 |
2014-12-08T15:26:43Z |
Layout design on multi-finger MOSFET for on-chip ESD protection circuits in a 0.18-mu m salicided CMOS process
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Ker, MD; Chuang, CH; Lo, WY |
| 國立交通大學 |
2014-12-08T15:26:38Z |
ESD protection circuits with novel MOS-bounded diode structures
|
Ker, MD; Chuang, CH |
| 國立交通大學 |
2014-12-08T15:26:38Z |
Latchup current self-stop circuit for whole-chip latchup prevention in bulk CMOS integrated circuits
|
Peng, JJ; Ker, MD; Jiang, HC |
| 國立交通大學 |
2014-12-08T15:26:37Z |
On-chip ESD protection circuit design with novel substrate-triggered SCR device in sub-quarter-micron CMOS process
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Ker, MD; Hsu, KC |
| 國立交通大學 |
2014-12-08T15:26:36Z |
ESD protection design to overcome internal damages on interface circuits of CMOS IC with multiple separated power pins
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Ker, MD; Chang, CY; Chang, YS |
| 國立交通大學 |
2014-12-08T15:26:36Z |
Design of negative charge pump circuit with polysilicon diodes in a 0.25-mu m CMOS process
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Ker, MD; Chang, CY; Jiang, HC |
| 國立交通大學 |
2014-12-08T15:26:35Z |
Novel ESD implantation for sub-quarter-micron CMOS technology with enhanced machine-model ESD robustness
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Ker, MD; Hsu, HC; Peng, JH |
| 國立交通大學 |
2014-12-08T15:26:34Z |
ESD protection design for mixed-voltage I/O circuit with substrate-triggered technique in sub-quarter-micron CMOS process
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Ker, MD; Chuang, CH; Hsu, KC; Lo, WY |
| 國立交通大學 |
2014-12-08T15:26:31Z |
ESD protection design for 900-MHz RF receiver with 8-kV HBM ESD robustness
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Ker, MD; Lo, WY; Lee, CM; Chen, CP; Kao, HS |
| 國立交通大學 |
2014-12-08T15:26:31Z |
ESD protection design for 900-MHz RF receiver with 8-kV HBM ESD robustness
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Ker, MD; Lo, WY; Lee, CM; Chen, CP; Kao, HS |
| 國立交通大學 |
2014-12-08T15:26:29Z |
Complementary substrate-triggered SCR devices for on-chip ESD protection circuits
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Ker, MD; Hsu, KC |
| 國立交通大學 |
2014-12-08T15:26:28Z |
Failure analysis of ESD damage in a high-voltage driver IC and the effective ESD protection solution
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Ker, MD; Peng, JJ; Jiang, HC |
| 國立交通大學 |
2014-12-08T15:26:23Z |
Electrostatic discharge implantation to improve machine-model ESD robustness of stacked NMOS in mixed-voltage I/O interface circuits
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Ker, MD; Hsu, HC; Peng, JJ |
| 國立交通大學 |
2014-12-08T15:26:22Z |
Novel electrostatic discharge protection design for nanoelectronics in nanoscale CMOS technology
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Ker, MD; Tseng, TK |
Showing items 51-75 of 129 (6 Page(s) Totally)
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