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教育部委託研究計畫      計畫執行:國立臺灣大學圖書館
 
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機構 日期 題名 作者
國立交通大學 2014-12-08T15:39:26Z A BENDING N-WELL BALLAST LAYOUT TO IMPROVE ESD ROBUSTNESS IN FULLY-SILICIDED CMOS TECHNOLOGY Wen, Yong-Ru; Ker, Ming-Dou; Chen, Wen-Yi
國立交通大學 2014-12-08T15:39:08Z Self-Matched ESD Cell in CMOS Technology for 60-GHz Broadband RF Applications Lin, Chun-Yu; Chu, Li-Wei; Ker, Ming-Dou; Lu, Tse-Hua; Hung, Ping-Fang; Li, Hsiao-Chun
國立交通大學 2014-12-08T15:38:52Z ESD Protection Circuit for High-Voltage CMOS ICs with Improved Immunity Against Transient-Induced Latchup Ker, Ming-Dou; Hsu, Che-Lun; Chen, Wen-Yi
國立交通大學 2014-12-08T15:38:45Z 2xVDD-Tolerant Power-Rail ESD Clamp Circuit With Low Standby Leakage in 65-nm CMOS Process Lin, Chun-Yu; Ker, Ming-Dou
國立交通大學 2014-12-08T15:38:25Z ESD Protection Design With Lateral DMOS Transistor in 40-V BCD Technology Wang, Chang-Tzu; Ker, Ming-Dou
國立交通大學 2014-12-08T15:37:35Z Design of Analog Pixel Memory for Low Power Application in TFT-LCDs Chu, Li-Wei; Liu, Po-Tsun; Ker, Ming-Dou
國立交通大學 2014-12-08T15:37:32Z Electrostatic Discharge Protection Design for High-Voltage Programming Pin in Fully-Silicided CMOS ICs Ker, Ming-Dou; Chen, Wen-Yi; Shieh, Wuu-Trong; Wei, I-Ju
國立交通大學 2014-12-08T15:36:53Z Study on ESD Protection Design with Stacked Low-Voltage Devices for High-Voltage Applications Dai, Chia-Tsen; Ker, Ming-Dou
國立交通大學 2014-12-08T15:36:23Z Evaluation of subcortical grey matter abnormalities in patients with MRI-negative cortical epilepsy determined through structural and tensor magnetic resonance imaging Peng, Syu-Jyun; Harnod, Tomor; Tsai, Jang-Zern; Ker, Ming-Dou; Chiou, Jun-Chern; Chiueh, Herming; Wu, Chung-Yu; Hsin, Yue-Loong
國立交通大學 2014-12-08T15:36:21Z Local CDM ESD Protection Circuits for Cross-Power Domains in 3D IC Applications Chen, Shih-Hung; Linten, Dimitri; Scholz, Mirko; Huang, Yu-Ching; Hellings, Geert; Boschke, Roman; Ker, Ming-Dou; Groeseneken, Guido
國立交通大學 2014-12-08T15:36:20Z Investigating electron depletion effect in amorphous indium-gallium-zinc-oxide thin-film transistor with a floating capping metal by technology computer-aided design simulation and leakage reduction Lu, Ting-Chou; Chen, Wei-Tsung; Zan, Hsiao-Wen; Ker, Ming-Dou
國立交通大學 2014-12-08T15:36:10Z Through Diffusion Tensor Magnetic Resonance Imaging to Evaluate the Original Properties of Neural Pathways of Patients with Partial Seizures and Secondary Generalization by Individual Anatomic Reference Atlas Peng, Syu-Jyun; Harnod, Tomor; Tsai, Jang-Zern; Huang, Chien-Chun; Ker, Ming-Dou; Chiou, Jun-Chern; Chiueh, Herming; Wu, Chung-Yu; Hsin, Yue-Loong
國立交通大學 2014-12-08T15:36:01Z On-Chip Transient Voltage Suppressor Integrated With Silicon-Based Transceiver IC for System-Level ESD Protection Chuang, Che-Hao; Ker, Ming-Dou
國立交通大學 2014-12-08T15:35:55Z Layout Consideration and Circuit Solution to Prevent EOS Failure Induced by Latchup Test in a High-Voltage Integrated Circuits Tsai, Hui-Wen; Ker, Ming-Dou
國立交通大學 2014-12-08T15:35:55Z On the Design of Power-Rail ESD Clamp Circuits With Gate Leakage Consideration in Nanoscale CMOS Technology Ker, Ming-Dou; Yeh, Chih-Ting
國立交通大學 2014-12-08T15:35:49Z Design of high-voltage-tolerant stimulus driver with adaptive loading consideration to suppress epileptic seizure in a 0.18-mu m CMOS process Lin, Chun-Yu; Li, Yi-Ju; Ker, Ming-Dou
國立交通大學 2014-12-08T15:35:37Z Synthesis of uniform core-shell gelatin-alginate microparticles as intestine-released oral delivery drug carrier Huang, Keng-Shiang; Yang, Chih-Hui; Kung, Chao-Ping; Grumezescu, Alexandru Mihai; Ker, Ming-Dou; Lin, Yung-Sheng; Wang, Chih-Yu
國立交通大學 2014-12-08T15:35:09Z Metal-layer capacitors in the 65 nm CMOS process and the application for low-leakage power-rail ESD clamp circuit Chiu, Po-Yen; Ker, Ming-Dou
國立交通大學 2014-12-08T15:35:09Z SCR-based transient detection circuit for on-chip protection design against system-level electrical transient disturbance Ker, Ming-Dou; Lin, Wan-Yen; Yen, Cheng-Cheng
國立交通大學 2014-12-08T15:33:56Z A Fully Integrated 8-Channel Closed-Loop Neural-Prosthetic CMOS SoC for Real-Time Epileptic Seizure Control Chen, Wei-Ming; Chiueh, Herming; Chen, Tsan-Jieh; Ho, Chia-Lun; Jeng, Chi; Ker, Ming-Dou; Lin, Chun-Yu; Huang, Ya-Chun; Chou, Chia-Wei; Fan, Tsun-Yuan; Cheng, Ming-Seng; Hsin, Yue-Loong; Liang, Sheng-Fu; Wang, Yu-Lin; Shaw, Fu-Zen; Huang, Yu-Hsing; Yang, Chia-Hsiang; Wu, Chung-Yu
國立交通大學 2014-12-08T15:33:13Z Analysis and Solution to Overcome EOS Failure Induced by Latchup Test in A High-Voltage Integrated Circuits Tsai, Hui-Wen; Ker, Ming-Dou; Liu, Yi-Sheng; Chuang, Ming-Nan
國立交通大學 2014-12-08T15:33:12Z Ultra-Low-Leakage Power-Rail ESD Clamp Circuit in a 65-nm CMOS Technology Altolaguirre, Federico A.; Ker, Ming-Dou
國立交通大學 2014-12-08T15:33:10Z Overview on ESD Protection Designs of Low-Parasitic Capacitance for RF ICs in CMOS Technologies Ker, Ming-Dou; Lin, Chun-Yu; Hsiao, Yuan-Wen
國立交通大學 2014-12-08T15:32:53Z Robust ESD Protection Design for 40-Gb/s Transceiver in 65-nm CMOS Process Lin, Chun-Yu; Chu, Li-Wei; Ker, Ming-Dou
國立交通大學 2014-12-08T15:32:18Z Power-Rail ESD Clamp Circuit With Diode-String ESD Detection to Overcome the Gate Leakage Current in a 40-nm CMOS Process Altolaguirre, Federico Agustin; Ker, Ming-Dou

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