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國立交通大學 |
2017-04-21T06:49:39Z |
Reliability study of InGaP/GaAs HBT for 28V operation
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Chau, Frank Hin-Fai; Lin, Barry Jia-Fu; Chen, Yan; Kretschmar, Mark; Lee, Chien-Ping; Wang, Nan-lei Larry; Sun, Xiaopeng; Ma, Wenlong; Xu, Sarah; Hu, Peter |
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