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Showing items 1-6 of 6 (1 Page(s) Totally)
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| 國立交通大學 |
2017-04-21T06:49:16Z |
The Impact of Layout Dependent Stress and Gate Resistance on High Frequency Performance and Noise in Multifinger and Donut MOSFETs
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Ku, Chih-You; Yeh, Kuo-Ling; Guo, Jyh-Chyurn |
| 國立交通大學 |
2014-12-12T01:27:03Z |
射頻金氧半場效電晶體元件佈局對高頻特性與低頻雜訊之影響以應用於射頻與類比電路
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古智友; Ku, Chih-You; 郭治群; Guo, Jyh-Chyurn |
| 國立交通大學 |
2014-12-08T15:48:37Z |
The Impact of Uni-axial Strain on Low Frequency Noise in Nanoscale p-Channel Metal-Oxide-Semiconductor Field Effect Transistors under Dynamic Body Biases
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Yeh, Kuo-Liang; Ku, Chih-You; Guo, Jyh-Chyurn |
| 國立交通大學 |
2014-12-08T15:39:09Z |
The Impact of MOSFET Layout Dependent Stress on High Frequency Characteristics and Flicker Noise
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Yeh, Kuo-Liang; Ku, Chih-You; Guo, Jyh-Chyurn |
| 國立交通大學 |
2014-12-08T15:24:43Z |
Flicker Noise in Nanoscale pMOSFETs with Mobility Enhancement Engineering and Dynamic Body Biases
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Yeh, Kuo-Liang; Ku, Chih-You; Hong, Wei-Lun; Guo, Jyh-Chyurn |
| 國立交通大學 |
2014-12-08T15:21:35Z |
Low Frequency Noise in Nanoscale pMOSFETs with Strain Induced Mobility Enhancement and Dynamic Body Biases
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Yeh, Kuo-Liang; Ku, Chih-You; Hong, Wei-Lun; Guo, Jyh-Chyurn |
Showing items 1-6 of 6 (1 Page(s) Totally)
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