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Showing items 1-6 of 6  (1 Page(s) Totally)
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Institution Date Title Author
國立交通大學 2017-04-21T06:49:16Z The Impact of Layout Dependent Stress and Gate Resistance on High Frequency Performance and Noise in Multifinger and Donut MOSFETs Ku, Chih-You; Yeh, Kuo-Ling; Guo, Jyh-Chyurn
國立交通大學 2014-12-12T01:27:03Z 射頻金氧半場效電晶體元件佈局對高頻特性與低頻雜訊之影響以應用於射頻與類比電路 古智友; Ku, Chih-You; 郭治群; Guo, Jyh-Chyurn
國立交通大學 2014-12-08T15:48:37Z The Impact of Uni-axial Strain on Low Frequency Noise in Nanoscale p-Channel Metal-Oxide-Semiconductor Field Effect Transistors under Dynamic Body Biases Yeh, Kuo-Liang; Ku, Chih-You; Guo, Jyh-Chyurn
國立交通大學 2014-12-08T15:39:09Z The Impact of MOSFET Layout Dependent Stress on High Frequency Characteristics and Flicker Noise Yeh, Kuo-Liang; Ku, Chih-You; Guo, Jyh-Chyurn
國立交通大學 2014-12-08T15:24:43Z Flicker Noise in Nanoscale pMOSFETs with Mobility Enhancement Engineering and Dynamic Body Biases Yeh, Kuo-Liang; Ku, Chih-You; Hong, Wei-Lun; Guo, Jyh-Chyurn
國立交通大學 2014-12-08T15:21:35Z Low Frequency Noise in Nanoscale pMOSFETs with Strain Induced Mobility Enhancement and Dynamic Body Biases Yeh, Kuo-Liang; Ku, Chih-You; Hong, Wei-Lun; Guo, Jyh-Chyurn

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