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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
南台科技大學 2017-12-28 Schottky Emission Distance and Barrier Height Properties of Bipolar Switching Gd:SiOx RRAM Devices under Different Oxygen Concentration Environments Kai-Huang Chen; Tsung-Ming Tsai; Chien-Min Cheng; Shou-Jen Huang; Kuan-Chang Chang; Shu-Ping Liang; Tai-Fa Young
南台科技大學 2017 Influence of Thermal Annealing Treatment on Bipolar Switching Properties of Vanadium Oxide Thin-Film Resistance Random-Access Memory Devices Kai-Huang Chen; Chien-Min Cheng; Ming-Cheng Kao; Kuan-Chang Chang; Ting-Chang Chang; Tsung-Ming Tsai; Sean Wu; Feng-Yi Su
國立高雄師範大學 2013-11-21 High performance of graphene oxide-doped silicon oxide-based resistance random access memory 陳榮輝; Rong-Huei Chen;Rui Zhang;Kuan-Chang Chang;Ting-Chang Chang;Tsung-Ming Tsai;Kai-Huang Chen;Jen-Chung Lou;Tai-Fa Young;Chih-Cheng Shih;Ya-Liang Yang;Yin-Chih Pan;Tian-Jian Chu;Syuan-Yong Huang;Chih-Hung Pan;Yu-Ting Su;Yong-En Syu;Simon M Sze
國立高雄師範大學 2013-10 Characteristics of hafnium oxide resistance random access memory with different setting compliance current 陳榮輝; Rong-Huei Chen;Yu-Ting Su;Kuan-Chang Chang;Ting-Chang Chang;Tsung-Ming Tsai;Rui Zhang;J. C. Lou;Tai-Fa Young;Kai-Huang Chen;Bae-Heng Tseng;Chih-Cheng Shih;Ya-Liang Yang;Min-Chen Chen;Tian-Jian Chu;Chih-Hung Pan;Yong-En Syu;Simon M. Sze
國立高雄師範大學 2013-08 Electrical conduction mechanism of Zn:SiOx resistance random access memory with supercritical CO2 fluid process 陳榮輝; Rong-Huei Chen;Kuan-Chang Chang;Tsung-Ming Tsai;Rui Zhang;Ting-Chang Chang;Kai-Huang Chen;Jung-Hui Chen;Tai-Fa Young; J. C. Lou;Tian-Jian Chu;Chih-Cheng Shih;Jhih-Hong Pan;Yu-Ting Su;Yong-En Syu; Cheng-Wei Tung;Min-Chen Chen;Jia-Jie Wu;Ying Hu;Simon M. Sze
國立高雄師範大學 2013-07 Endurance Improvement Technology With Nitrogen Implanted in the Interface of WSiOx Resistance Switching Device 陳榮輝; Rong-Huei Chen;Yong-En Syu;Rui Zhang;Ting-Chang Chang;Tsung-Ming Tsai;Kuan-Chang Chang;Jen-Chung Lou;Tai-Fa Young;Min-Chen Chen;Ya-Liang Yang;Chih-Cheng Shih;Tian-Jian Chu;Jian-Yu Chen;Chih-Hung Pan;Yu-Ting Su;Hui-Chun Huang;Der-Shin Gan;Simon M. Sze
國立高雄師範大學 2013-05 The effect of high/low permittivity in bilayer HfO2/BN resistance random access memory 陳榮輝; Rong-Huei Chen;Jen-Wei Huang;Rui Zhang;Ting-Chang Chang;Tsung-Ming Tsai;Kuan-Chang Chang;Jen-Chung Lou;Tai-Fa Young;Jung-Hui Chen;Hsin-Lu Chen;Yin-Chih Pan;Xuan Huang;Fengyan Zhang;Yong-En Syu;Simon M. Sze
國立高雄師範大學 2013-05 Hopping Effect of Hydrogen-Doped Silicon Oxide Insert RRAM by Supercritical CO2 Fluid Treatment 陳榮輝; Rong-Huei Chen;Kuan-Chang Chang;Chih-Hung Pan;Ting-Chang Chang;Tsung-Ming Tsai;Rui Zhang;Jen-Chung Lou;Tai-Fa Young;Chih-Cheng Shih;Tian-Jian Chu;Jian-Yu Chen;Yu-Ting Su;Jhao-Ping Jiang;Kai-Huang Chen;Hui-Chun Huang;Yong-En Syu;Der-Shin Gan;Simon M. Sze
國立高雄師範大學 2013-05 Origin of Hopping Conduction in Graphene Oxide-Doped Silicon Oxide Resistance Random Access Memory Devices 陳榮輝; Rong-Huei Chen;Kuan-Chang Chang;Rui Zhang;Ting-Chang Chang;Tsung-Ming Tsai;Jen-Chung Lou;Tai-Fa Young;Min-Chen Chen;Ya-Liang Yang;Yin-Chih Pan;Geng-Wei Chang;Tian-Jian Chu;Chih-Cheng Shih;Jian-Yu Chen;Chih-Hung Pan;Yu-Ting Su;Yong-En Syu;Ya-Hsiang Tai;Simon M. Sze
國立高雄師範大學 2013-04 Hopping conduction distance dependent activation energy characteristics of Zn:SiO2 resistance random access memory devices 陳榮輝; Rong-Huei Chen;Kai-Huang Chen;Rui Zhang;Ting-Chang Chang;Tsung-Ming Tsai;Kuan-Chang Chang;Jen-Chung Lou;Tai-Fa Young; Chih-Cheng Shih;Cheng-Wei Tung;Yong-En Syu;Simon M. Sze
國立高雄師範大學 2013-04 Low Temperature Improvement Method on Zn:SiOx Resistive Random Access Memory Devices 陳榮輝; Rong-Huei Chen;Kuan-Chang Chang;Tsung-Ming Tsai;Ting-Chang Chang;Hsing-Hua Wu;Kai-Huang Chen;Tai-Fa Young;Tian-Jian Chu;Jian-Yu Chen;Chih-Hung Pan;Yu-Ting Su;Yong-En Syu;Cheng-Wei Tung;Geng-Wei Chang;Min-Chen Chen;Hui-Chun Huang;Ya-Hsiang Tai;Der-Shin Gan;Jia-Jie Wu;Ying Hu;Simon M. Sze
國立高雄師範大學 2013-03 Characteristics and Mechanisms of Silicon Oxide Based Resistance Random Access Memory 陳榮輝; Rong-Huei Chen;Kuan-Chang Chang;Tsung-Ming Tsai;Ting-Chang Chang;Hsing-Hua Wu;Yong-En Syu;Geng-Wei Chang;Tian-Jian Chu;Guan-Ru Liu;Yu-Ting Su;Min-Chen Chen;Jhih-Hong Pan;Jian-Yu Chen;Cheng-Wei Tung;Hui-Chun Huang;Ya-Hsiang Tai;Der-Shin Gan;Simon M. Sze

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