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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
元智大學 2018-05-20 Key Parameter Identification for Faulty Wafer Detection Using Image Processing Shu-Kai S. Fan; Du-Ming Tsai; Chih-Hung Jen; Rui-Yu Huang; Kuan-Lung Chen
國立臺灣海洋大學 1997 A necessary and sufficient condition for the solvability of perturbed Nevanlinna-Pick interpolation problems Chee-Fai Yung; Fang-Bo Yeh; Jyun-Tswun Lin; Kuan-Lung Chen

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