臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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	2019臺灣學術機構典藏研討會
	機構典藏系統RC7版本已發佈

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Institution	Date	Title	Author
國立成功大學	2022-07	Efficient Test Compression Configuration Selection	Ye;Chong-Siao;Zheng;Shi-Xuan;Tsai;Fong-Jyun;Wang;Chen;Lee;Kuen-Jong;Cheng;Wu-Tung;Reddy;Sudhakar, M.;Zawada;Justyna;Kassab;Mark;Rajski;Janusz
國立成功大學	2022-03	An Efficient Procedure to Generate Highly Compact Diagnosis Patterns for Transition Faults	Lee;Kuen-Jong;Wu;Cheng-Hung;Hou;Tsung-Yu
國立成功大學	2022-01-1	A Dynamic-Key Based Secure Scan Architecture for Manufacturing and In-Field IC Testing	Lee;Kuen-Jong;Liu;Ching-An;Wu;Chia-Chi
國立成功大學	2022	A Secure JTAG Wrapper for SoC Testing and Debugging	Lee;Kuen-Jong;Lu;Zheng-Yao;Yeh;Shih-Chun
國立成功大學	2021-04	Test Chips With Scan-Based Logic Arrays	Chen;Yu-Hsiang;Hsu;Chia-Ming;Lee;Kuen-Jong
國立成功大學	2020-06	Generating Single- and Double-Pattern Tests for Multiple CMOS Fault Models in One ATPG Run	Kung;Yi-Cheng;Lee;Kuen-Jong;Reddy;Sudhakar, M.
國立成功大學	2019-02	On-Chip Self-Test Methodology With All Deterministic Compressed Test Patterns Recorded in Scan Chains	Lee;Kuen-Jong;Chen;Bo-Ren;Kochte;Andreas, Michael
國立成功大學	2018-11	A Repair-for-Diagnosis Methodology for Logic Circuits	Wu;Cheng-Hung;Lin;Sheng-Lin;Lee;Kuen-Jong;Reddy;Sudhakar, M.
國立成功大學	2017-06	Built-In Test and Diagnosis for TSVs With Different Placement Topologies and Crosstalk Impact Ranges	Hsu;Wen-Hsuan;Kochte;Andreas, Michael;Lee;Kuen-Jong
國立成功大學	2017-01	Test Stimulus Compression Based on Broadcast Scan With One Single Input	Chen;Jhen-Zong;Lee;Kuen-Jong

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