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Showing items 1-14 of 14 (1 Page(s) Totally)
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| 國立成功大學 |
2011-09 |
Origin of Stress Memorization Mechanism in Strained-Si nMOSFETs Using a Low-Cost Stress-Memorization Technique
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Huang, Yao-Tsung; Wu, San-Lein; Chang, Shoou-Jinn; Kuo, Cheng-Wen; Chen, Ya-Ting; Cheng, Yao-Chin; Cheng, Osbert |
| 國立成功大學 |
2011-07-22 |
應變金氧半場效電晶體之低頻雜訊研究
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郭正聞; Kuo, Cheng-Wen |
| 國立成功大學 |
2011-07-13 |
應變金氧半場效電晶體之低頻雜訊研究
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郭正聞; Kuo, Cheng-Wen |
| 國立成功大學 |
2011-06 |
Temperature Dependence of Electrical Characteristics of Strained nMOSFETs Using Stress Memorization Technique
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Huang, Po Chin; Wu, San Lein; Chang, Shoou Jinn; Kuo, Cheng Wen; Chang, Ching Yao; Huang, Yao Tsung; Cheng, Yao Chin; Cheng, Osbert |
| 國立成功大學 |
2011-05 |
Enhancement of CMOSFETs Performance by Utilizing SACVD-Based Shallow Trench Isolation for the 40-nm Node and Beyond
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Huang, Yao-Tsung; Wu, San-Lein; Chang, Shoou-Jinn; Hung, Chin-Kai; Wang, Tzu-Juei; Kuo, Cheng-Wen; Huang, Cheng-Tung; Cheng, Osbert |
| 國立成功大學 |
2011-04 |
Investigation of stress memorization process on low-frequency noise performance for strained Si n-type metal-oxide-semiconductor field-effect transistors
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Kuo, Cheng-Wen;Wu, San-Lein;Lin, Hau-Yu;Huang, Yao-Tsung;Chang, Shoou-Jinn;Hong, De-Gong;Wu, Chung-Yi;Cheng, Yao-Chin;Cheng, Osbert |
| 國立成功大學 |
2009-08 |
DC and 1/f noise characteristics of strained-Si nMOSFETs using chemical-mechanical-polishing technique
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Lin, Hau Yu; Wu, San Lein; Chang, Shoou Jinn; Kuo, Cheng Wen; Wang, Yen Ping; Hung, Shang Chao |
| 國立成功大學 |
2009-08 |
Investigation of interface characteristics in strained-Si nMOSFETs
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Kuo, Cheng Wen; Wu, San Lein; Chang, Shoou Jinn; Lin, Hau Yu; Wang, Yen Ping; Hung, Shang Chao |
| 國立成功大學 |
2009-04 |
Impact of Ge Content on Flicker Noise Behavior of Strained-SiGe p-Type Metal-Oxide-Semiconductor Field-Effect Transistors
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Wu, San-Lein; Wu, Chung Yi; Lin, Hau-Yu; Kuo, Cheng-Wen; Chen, Shin-Hsin; Lin, Chung Hsiung; Chang, Shoou-Jinn |
| 國立成功大學 |
2009-01 |
Strained-Si nMOSFET with a raised source/drain structure
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Lin, H. Y.; Wu, San-Lein; Chang, Shoou-Jinn; Wang, Yen-Ping; Lin, Yu-Min; Kuo, Cheng-Wen |
| 國立成功大學 |
2008-10 |
Low-frequency noise of strained-Si nMOSFETs fabricated on a chemical-mechanical-polished SiGe virtual substrate
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Lin, H. Y.; Wu, San-Lein; Chang, Shoou-Jinn; Wang, Yen-Ping; Kuo, Cheng-Wen |
| 中原大學 |
2008-07-23 |
改良粒子群演算法以解決背包問題
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溫國政; Kuo-Cheng Wen |
| 國立成功大學 |
2007-07-19 |
Negative bias temperature instability characteristics of strained SiGe pMOSFETs
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Lee, C. H.; Wu, San-Lein; Chen, Shin-Hsin; Kuo, Cheng-Wen; Lin, Y. M.; Chen, J. E.; Chang, Shoou-Jinn |
| 亞洲大學 |
2006 |
An Integrated System for Cancer-Related Genes Mining and Prediction
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Kuo-Cheng Wen |
Showing items 1-14 of 14 (1 Page(s) Totally)
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