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Showing items 1-3 of 3 (1 Page(s) Totally)
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| 國立成功大學 |
2001-02 |
A novel programming technique for highly scalable and disturbance immune flash EEPROM
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Huang, Kuo-Ching; Fang, Yean-Kuen; Yaung, Dun-Nian; Chen, Chung-Hui; Hsu, Yung-Lung; Ting, Shyh-Fann; Lin, Yvonne; Kuo, Di-son; Wang, Chung S.; Liang, Mong-Song |
| 國立成功大學 |
2000-07 |
The impacts of control gate voltage on the cycling endurance of split gate flash memory
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Huang, Kuo-Ching; Fang, Yean-Kuen; Yaung, Dun-Nian; Chen, Chii-Wen; Sung, Hung-Cheng; Kuo, Di-Son; Wang, Chung-Shu; Liang, Mong-Song |
| 國立成功大學 |
1999-08 |
Effect of substrate bias on the performance and reliability of the split-gate source-side injected flash memory
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Huang, Kuo-Ching; Fang, Yean-Kuen; Yaung, Dun-Nian; Chen, Chii-Wen; Sung, Hung-Cheng; Kuo, Di-Son; Wang, C. S.; Liang, Mong-Song |
Showing items 1-3 of 3 (1 Page(s) Totally)
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