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Showing items 1-10 of 10 (1 Page(s) Totally) 1 View [10|25|50] records per page
國立交通大學 |
2014-12-08T15:37:33Z |
Experimental Investigation of Surface-Roughness-Limited Mobility in Uniaxial Strained pMOSFETs
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Chen, William P. N.; Kuo, Jack J. Y.; Su, Pin |
國立交通大學 |
2014-12-08T15:32:43Z |
Source/Drain Series Resistance Induced Feedback Effect on Drain Current Mismatch and Its Implication
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Kuo, Jack J. -Y.; Fan, Ming-Long; Lee, Wei; Su, Pin |
國立交通大學 |
2014-12-08T15:24:28Z |
Investigation of Low Frequency Noise in Uniaxial Strained PMOSFETs
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Kuo, Jack J. -Y.; Chen, William P. -N.; Su, Pin |
國立交通大學 |
2014-12-08T15:21:55Z |
Impact of Uniaxial Strain on Channel Backscattering Characteristics and Drain Current Variation for Nanoscale PMOSFETs
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Lee, Wei; Kuo, Jack J. -Y.; Chen, Willian P. -N.; Su, Pin; Jeng, Min-Chie |
國立交通大學 |
2014-12-08T15:21:19Z |
Self-Heating Induced Feedback Effect on Drain Current Mismatch and Its Modeling
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Kuo, Jack J-Y.; Su, Pin |
國立交通大學 |
2014-12-08T15:14:23Z |
Investigation of analogue performance for process-induced-strained PMOSFETs
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Kuo, Jack J-Y; Chen, William P-N; Su, Pin |
國立交通大學 |
2014-12-08T15:13:45Z |
On the enhanced impact ionization in uniaxial strained p-MOSFETs
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Su, Pin; Kuo, Jack J. -Y. |
國立交通大學 |
2014-12-08T15:09:23Z |
Impact of Uniaxial Strain on Low-Frequency Noise in Nanoscale PMOSFETs
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Kuo, Jack J. -Y.; Chen, William P. -N.; Su, Pin |
國立交通大學 |
2014-12-08T15:06:58Z |
Impact of Process-Induced Uniaxial Strain on the Temperature Dependence of Carrier Mobility in Nanoscale pMOSFETs
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Chen, William P. N.; Kuo, Jack J. Y.; Su, Pin |
國立交通大學 |
2014-12-08T15:06:58Z |
Enhanced Carrier-Mobility-Fluctuation Origin Low-Frequency Noise in Uniaxial Strained PMOSFETs
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Kuo, Jack J. -Y.; Chen, William P. -N.; Su, Pin |
Showing items 1-10 of 10 (1 Page(s) Totally) 1 View [10|25|50] records per page
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