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Showing items 1-4 of 4 (1 Page(s) Totally) 1 View [10|25|50] records per page
國立交通大學 |
2017-04-21T06:49:26Z |
Statistical Techniques for Predicting System-Level Failure using Stress-Test Data
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Chen, Harry H.; Kuo, Shih-Hua; Tung, Jonathan; Chao, Mango C. -T. |
國立交通大學 |
2017-04-21T06:49:25Z |
Random Pattern Generation for Post-Silicon Validation of DDR3 SDRAM
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Yang, Hao-Yu; Kuo, Shih-Hua; Huang, Tzu-Hsuan; Chen, Chi-Hung; Lin, Chris; Chao, Mango C. -T. |
國立交通大學 |
2014-12-12T02:45:17Z |
降壓超頻測試: 藉由晶片的錯誤行為來預測系統層級錯誤
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郭士華; Kuo, Shih-Hua; 趙家佐; Chao, Chia-Tso |
國立交通大學 |
2014-12-08T15:33:13Z |
Testing Retention Flip-flops in Power-gated Designs
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Hsu, Hao-Wen; Kuo, Shih-Hua; Chang, Wen-Hsiang; Chen, Shi-Hao; Chang, Ming-Tung; Chao, Mango C. -T. |
Showing items 1-4 of 4 (1 Page(s) Totally) 1 View [10|25|50] records per page
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