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Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
國立交通大學 |
2017-04-21T06:49:01Z |
Improvement of Oxide Reliability in NAND Flash Memories Using Tight Endurance Cycling with Shorter Idling Period
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Shirota, R.; Yang, B-J.; Chiu, Y-Y.; Wu, Y-T.; Wang, P-Y.; Chang, J-H.; Yano, M.; Aoki, M.; Takeshita, T.; Wang, C-Y.; Kurachi, I. |
國立交通大學 |
2015-07-21T08:31:13Z |
New Accurate Method to Analyze both Floating Gate Charge and Tunnel Oxide Trapped Charge Profile in NAND Flash Memory
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Shirota, R.; Yang, B-J.; Chiu, Y-Y; Chen, H-T.; Ng, S-F.; Wang, P-Y.; Chang, J-H.; Kurachi, I. |
Showing items 1-2 of 2 (1 Page(s) Totally) 1 View [10|25|50] records per page
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