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Showing items 1-3 of 3 (1 Page(s) Totally) 1 View [10|25|50] records per page
亞洲大學 |
2014-06-10 |
Hot Carrier Injection (HCI) Reliability and Isolation Voltage Calibration of 80V High-Side NLDMOS and Transient Voltage Suppressor (TVS) Diode
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Kurniawan, Erry Dwi |
亞洲大學 |
2014-03 |
Investigation of Current Density and Hotspot Temperature Distribution Effects on P-channel LDMOSFET Unclamped Inductive Switching ;UIS) Test
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Kur, Erry Dwi;Kurniawan, Erry Dwi;Fra, Antonius; Ankit Kuma; Ankit Kumar;楊紹明;Yang, Shao-Ming;許健;Sheu, Gene |
亞洲大學 |
201306 |
P-type Shallow Junction as-Implanted Profile Prediction Using Kinetic Monte Carlo Simulation
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Fra, Antonius;Kur, Erry Dwi;Kurniawan, Erry Dwi;Manjunatha, M;Manjunatha, M.;楊紹明;Yang, Shao-Ming;許健;Sheu, Gene |
Showing items 1-3 of 3 (1 Page(s) Totally) 1 View [10|25|50] records per page
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