| 國立臺灣海洋大學 |
2008-06-09 |
Supressing series resistance in organic solar cells by oxygen plasma treatment
|
C. H. Lin;S. C. Tseng;Y. K. Liu;Y. Tai;S. Chattopadhyay;C. F. Lin;J. H. Lee;J. S. Hwang;Y. Y Hsu;L. C. Chen;W. C. Chen;K. H. Chen |
| 國立臺灣海洋大學 |
2008 |
Synthesis of titanium oxide and copper oxide nanostructures using anodic oxidation
|
Z. F. Chen;F. S. Wu;C. H. Yen;T. Y. Lin;J. S. Hwang;K. H. Chen;L. C. Chen |
| 國立臺灣海洋大學 |
2007-01 |
Nano-oxidation and trench formation of gallium nitride using photo-assisted atomic force microscopy
|
J. S. Hwang;L. W. Chen;Z. S. Hu;T. Y. Lu;T. Y. Lin;C. L. Hsiao;Y. Y. Jhuo3;C. Y. Cheng;K. H. Chen;L. C. Chen |
| 國立中山大學 |
2007 |
Photoluminescence spectroscopy of nearly defect-free InN microcrystals exhibiting nondegenerate semiconductor behaviors
|
C.L. Hsiao;H.C. Hsu;L.C. Chen;C.T. Wu;C.W. Chen;M. Chen;L.W. Tu;K.H. Chen |
| 國立臺灣海洋大學 |
2006-07 |
Photo-assisted Local Oxidation of gallium nitride Using Atomic Force Microscopy
|
J. S. Hwang;Z. S. Hu;T. Y. Lu;L. W. Chen;S. W. Chen;T. Y. Lin;C. L. Hsiao;K. H. Chen;L. C. Chen |
| 國立臺灣海洋大學 |
2006-04 |
Lasing Action in InN Nanotips Synthesized by Metalorganic Chemical Vapor Deposition
|
J. S. Hwang;G. M. Hsu;S. C. Shi;C. F. Chen;L. C. Chen;K. H. Chen |
| 國立中山大學 |
2006 |
Electronic structures of group-III-nitride nanorods studied by x-ray absorption, x-ray emission, and Raman spectroscopy
|
C.W. Pao;P.D. Babu;H.M. Tsai;J.W. Chiou;S.C. Ray;S.C. Yang;F.Z. Chien;W.F. Pong;M.H. Tsai;C.W. Hsu;L.C. Chen;C.C. Chen;K.H. Chen;H.J. Lin;J.F. Lee;J.H. Guo |
| 元智大學 |
2005-12 |
Web page prediction from metasearch results
|
陸承志; L C Chen |
| 國立臺灣海洋大學 |
2005-09-26 |
Response to “Comment on ‘Direct evidence of nanocluster-induced luminescence in InGaN epifilms’
|
H. J. Chang;C. H. Chen;Y. F. Chen;T. Y. Lin;L. C. Chen;K. H. Chen;Z. H. Lan |
| 國立臺灣海洋大學 |
2005-02 |
Antireflection and Solar Cell Application of Nanotip Arrays Fabricated by Selfmasked Dry Etching Technique
|
G. L. Ku;Y. F. Huang;Y. J. Wu;F. K. Chiang;H. C. Lo;K. H. Chen;L. C. Chen;C. F. Chen;C. R. Lin;J. S. Hwang;Y. R. Chang;P. K. Wei |
