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Showing items 1-5 of 5 (1 Page(s) Totally) 1 View [10|25|50] records per page
臺大學術典藏 |
2020-06-16T06:33:13Z |
Erratum: Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si1-x-yGexCy alloy layers on Si (100)" (Appl. Phys. Lett. (1995) 67 (3915))
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Amour, A.St.;Liu, C.W.;Sturm, J.C.;Lacroix, Y.;Thewalt, M.L.W.; Amour, A.St.; Liu, C.W.; Sturm, J.C.; Lacroix, Y.; Thewalt, M.L.W.; CHEE-WEE LIU |
臺大學術典藏 |
2018-09-10T05:23:46Z |
Erratum: Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si1-x-yGexCy alloy layers on Si (100)" (Appl. Phys. Lett. (1995) 67 (3915))
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Amour, A.St.;Liu, C.W.;Sturm, J.C.;Lacroix, Y.;Thewalt, M.L.W.; Amour, A.St.; Liu, C.W.; Sturm, J.C.; Lacroix, Y.; Thewalt, M.L.W.; CHEE-WEE LIU |
臺大學術典藏 |
2018-09-10T05:23:46Z |
Erratum: Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si1-x-yGexCy alloy layers on Si (100)" (Appl. Phys. Lett. (1995) 67 (3915))
|
Amour, A.St.;Liu, C.W.;Sturm, J.C.;Lacroix, Y.;Thewalt, M.L.W.; Amour, A.St.; Liu, C.W.; Sturm, J.C.; Lacroix, Y.; Thewalt, M.L.W.; CHEE-WEE LIU |
臺大學術典藏 |
2018-09-10T05:23:46Z |
Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si1-x-yGexCy alloy layers on Si (100)
|
St. Amour, A.;Liu, C.W.;Sturm, J.C.;Lacroix, Y.;Thewalt, M.L.W.; St. Amour, A.; Liu, C.W.; Sturm, J.C.; Lacroix, Y.; Thewalt, M.L.W.; CHEE-WEE LIU |
臺大學術典藏 |
2018-09-10T05:23:46Z |
Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si1-x-yGexCy alloy layers on Si (100)
|
St. Amour, A.;Liu, C.W.;Sturm, J.C.;Lacroix, Y.;Thewalt, M.L.W.; St. Amour, A.; Liu, C.W.; Sturm, J.C.; Lacroix, Y.; Thewalt, M.L.W.; CHEE-WEE LIU |
Showing items 1-5 of 5 (1 Page(s) Totally) 1 View [10|25|50] records per page
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