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Showing items 1-5 of 5 (1 Page(s) Totally)
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| 國立交通大學 |
2019-04-02T05:58:56Z |
Unipolar Switching Behaviors of RTO WOX RRAM
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Chien, W. C.; Chen, Y. C.; Lai, E. K.; Yao, Y. D.; Lin, P.; Horng, S. F.; Gong, J.; Chou, T. H.; Lin, H. M.; Chang, M. N.; Shih, Y. H.; Hsieh, K. Y.; Liu, R.; Lu, Chih-Yuan |
| 國立交通大學 |
2018-08-21T05:56:44Z |
A highly reliable self-aligned graded oxide WOx resistance memory: Conduction mechanisms and reliability
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Ho, ChiaHua; Lai, E. K.; Lee, M. D.; Pan, C. L.; Yao, Y. D.; Hsieh, K. Y.; Liu, Rich; Lu, C. Y. |
| 國立交通大學 |
2017-04-21T06:49:40Z |
MULTI-LEVEL OPERATION OF FULLY CMOS COMPATIBLE WOX RESISTIVE RANDOM ACCESS MEMORY (RRAM)
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Chien, W. C.; Chen, Y. C.; Chang, K. P.; Lai, E. K.; Yao, Y. D.; Lin, P.; Gong, J.; Tsai, S. C.; Hsieh, S. H.; Chen, C. F.; Hsieh, K. Y.; Liu, R.; Lu, Chih-Yuan |
| 國立交通大學 |
2017-04-21T06:48:15Z |
Insight of stress effect on the ONO stack layer in a SONOS-type flash memory cell
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Yeh, C. C.; Liao, Y. Y.; Wang, Tahui; Tsai, W. J.; Lu, T. C.; Kao, H. L.; Ou, T. F.; Chen, M. S.; Chen, Y. K.; Lai, E. K.; Shih, Y. H.; Ting, WenChi; Ku, Y. H. Joseph; Lit, Chih-Yuan |
| 國立交通大學 |
2014-12-08T15:07:29Z |
Unipolar Switching Behaviors of RTO WO(X) RRAM
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Chien, W. C.; Chen, Y. C.; Lai, E. K.; Yao, Y. D.; Lin, P.; Horng, S. F.; Gong, J.; Chou, T. H.; Lin, H. M.; Chang, M. N.; Shih, Y. H.; Hsieh, K. Y.; Liu, R.; Lu, Chih-Yuan |
Showing items 1-5 of 5 (1 Page(s) Totally)
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