臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)

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Institution	Date	Title	Author
國立交通大學	2014-12-08T15:25:06Z	ESC robustness of 40-V CMOS devices with/without drift implant	Chang, Wei-Jen; Ker, Ming-Dou; Lai, Tai-Hsiang; Tang, Tien-Hao; Su, Kuan-Cheng
國立交通大學	2014-12-08T15:10:44Z	Investigation on Robustness of CMOS Devices Against Cable Discharge Event (CDE) Under Different Layout Parameters in a Deep-Submicrometer CMOS Technology	Ker, Ming-Dou; Lai, Tai-Hsiang

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