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Showing items 1-5 of 5 (1 Page(s) Totally)
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| 臺大學術典藏 |
2018-09-10T08:19:10Z |
CSER: BISER-based concurrent soft-error resilience
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Laung-Terng Wang;Touba, N.A.;Zhigang Jiang;Shianling Wu;Jiun-Lang Huang;Li, J.C.-M.; Laung-Terng Wang; Touba, N.A.; Zhigang Jiang; Shianling Wu; Jiun-Lang Huang; Li, J.C.-M.; CHIEN-MO LI; JIUN-LANG HUANG |
| 臺大學術典藏 |
2018-09-10T08:19:10Z |
CSER: BISER-based concurrent soft-error resilience
|
Laung-Terng Wang;Touba, N.A.;Zhigang Jiang;Shianling Wu;Jiun-Lang Huang;Li, J.C.-M.; Laung-Terng Wang; Touba, N.A.; Zhigang Jiang; Shianling Wu; Jiun-Lang Huang; Li, J.C.-M.; CHIEN-MO LI; JIUN-LANG HUANG |
| 臺大學術典藏 |
2018-09-10T07:09:33Z |
On Optimizing Fault Coverage, Pattern Count, and ATPG Run Time Using A Hybrid Single-Capture Scheme for Testing Scan Designs
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Shianling Wu; Laung-Terng Wang; Zhigang Jiang; Jiayong Song; Boryau Sheu; Xiaoqing Wen; James C.-M. Li; Jiun-Lang Huang; Ravi Apte; CHIEN-MO LI |
| 臺大學術典藏 |
2009-01 |
Test Response Compaction in the Presence of Many Unknowns
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Laung-Terng Wang; CHIEN-MO LI; Amy Rao; Yi-Chih Sung; James C.-M. Lim; Wei-Che Wang; Wei-Che Wang;James C.-M. Lim;Yi-Chih Sung;Amy Rao;Laung-Terng Wang |
| 臺大學術典藏 |
2009-01 |
Test Response Compaction in the Presence of Many Unknowns
|
Laung-Terng Wang; CHIEN-MO LI; Amy Rao; Yi-Chih Sung; James C.-M. Lim; Wei-Che Wang; Wei-Che Wang;James C.-M. Lim;Yi-Chih Sung;Amy Rao;Laung-Terng Wang |
Showing items 1-5 of 5 (1 Page(s) Totally)
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