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Showing items 1-4 of 4 (1 Page(s) Totally)
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| 國立交通大學 |
2014-12-08T15:20:56Z |
Assessment of ESD Robustness in High Power Light-Emitting Diodes
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Yang, Shih-Chun; Lin, Pang; Fu, Han-Kuei; Wang, Chien-Ping; Chen, Tzung-Te; Lee, An-Tse; Huang, Sheng-Bang; Chou, Pei-Ting; Wang, Wei; Kao, Fu-Jen |
| 國立交通大學 |
2014-12-08T15:11:59Z |
Accelerated Degradation of High Power Light-Emitting Diode Resulted from Inhomogeneous Current Distribution
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Yang, Shih Chun; Lin, Pang; Fu, Han Kuei; Lee, An Tse; Chen, Tzung Te; Wang, Chien Ping; Huang, Sheng Bang; Chou, Pei Ting |
| 國立交通大學 |
2014-12-08T15:06:57Z |
Variation of Electrostatic Discharge Robustness Induced by the Surface Morphology of High Power Light-Emitting Diodes
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Yang, Shih Chun; Lin, Pang; Fu, Han Kuei; Wang, Chien Ping; Chen, Tzung Te; Lee, An Tse; Huang, Sheng Bang; Chu, Mu Tao |
| 國立交通大學 |
2014-12-08T15:06:37Z |
Failure and degradation mechanisms of high-power white light emitting diodes
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Yang, Shih-Chun; Lin, Pang; Wang, Chien-Ping; Huang, Sheng Bang; Chen, Chiu-Ling; Chiang, Pei-Fang; Lee, An-Tse; Chu, Mu-Tao |
Showing items 1-4 of 4 (1 Page(s) Totally)
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