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| 國立交通大學 |
2017-04-21T06:48:36Z |
Study on Oxygen-dependent Instability of Amorphous In-Ga-Zn-O TFT and Completely Stable Device under Both Positive and Negative Bias Stresses
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Chen, Wei-Tsung; Zan, Hsiao-Wen; Lo, Shih-Yi; Kao, Shih-Chin; Tsai, Chuang-Chuang; Lin, Jian-Hong; Fang, Chun-Hsiang; Lee, Chung-Chun |
| 國立交通大學 |
2014-12-08T15:22:43Z |
Reliability improvement of InGaZnO thin film transistors encapsulated under nitrogen ambient
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Wu, Chun-Yu; Cheng, Huang-Chung; Wang, Chao-Lung; Liao, Ta-Chuan; Chiu, Po-Chun; Tsai, Chih-Hung; Fang, Chun-Hsiang; Lee, Chung-Chun |
| 國立交通大學 |
2014-12-08T15:20:40Z |
Oxygen-Dependent Instability and Annealing/Passivation Effects in Amorphous In-Ga-ZnO Thin-Film Transistors
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Chen, Wei-Tsung; Lo, Shih-Yi; Kao, Shih-Chin; Zan, Hsiao-Wen; Tsai, Chuang-Chuang; Lin, Jian-Hong; Fang, Chun-Hsiang; Lee, Chung-Chun |
Showing items 1-3 of 3 (1 Page(s) Totally)
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