English  |  正體中文  |  简体中文  |  Total items :2817995  
Visitors :  27956900    Online Users :  341
Project Commissioned by the Ministry of Education
Project Executed by National Taiwan University Library
 
臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
About TAIR

Browse By

News

Copyright

Related Links

"lee j r"

Return to Browse by Author
Sorting by Title Sort by Date

Showing items 26-35 of 53  (6 Page(s) Totally)
<< < 1 2 3 4 5 6 > >>
View [10|25|50] records per page

Institution Date Title Author
國立臺灣科技大學 2016 VoiceCode: A 2D barcode system for digital audio encoding Lee, J.R;Ruan, S.-J;Lin, C.H.
國立臺灣大學 2012-06 探究動態能耐的緣起:誘發多樣化的技術創新例規 Wen, S.H.;Lee, J.R.; 文馨瑩;李吉仁
國立臺灣科技大學 2010 Relational and transactional factors as hybrid criteria for buyer project selection (BPS): An exploratory study from industrial suppliers' perspective Lee W.; Lin T.M.Y.; Lee W.; Lee J.-R.
臺大學術典藏 2009 Corrigendum to "Optical characterization of CdSe nanocrystals" [J. Phys. Chem. Solids 69(2-3) (2008) 629-632] (DOI:10.1016/j.jpcs.2007.07.051) Chen, C.-y.; Lee, J.-R.; Chia, C.-T.; Lu, C.-R.; Liu, I.-S.; Su, W.-F.; WEI-FANG SU
國立成功大學 2008-08 Mechanism and improvement of on-resistance degradation induced by avalanche breakdown in lateral DMOS transistors Chen, Jone F.; Lee, J. R.; Wu, Kuo-Ming; Huang, Tsung-Yi; Liu, C. A.
國立成功大學 2008-07-31 Gate current dependent hot-carrier-induced degradation in LDMOS transistors Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Lee, J. R.; Wu, Kuo-Ming; Huang, T. Y.; Liu, C. M.
國立成功大學 2008-07 Effect of drift-region concentration on hot-carrier-induced R-on degradation in nLDMOS transistors Chen, Jone F.; Lee, J. R.; Wu, Kuo-Ming; Huang, Tsung-Yi; Liu, C. M.
國立成功大學 2008-06-16 Mechanism and lifetime prediction method for hot-carrier-induced degradation in lateral diffused metal-oxide-semiconductor transistors Chen, Jone F.; Tian, Kuen-Shiuan; Chen, Shiang-Yu; Lee, J. R.; Wu, Kuo-Ming; Liu, C. M.
國立成功大學 2008-05 Anomalous hot-caffier-induced increase in saturation-region drain current in n-type lateral diffused metal-oxide-semiconductor transistors Chen, Shiang-Yu; Chen, Jone F.; Lee, J. R.; Wu, Kuo-Ming; Liu, C. M.; Hsu, S. L.
國立成功大學 2008-04 An investigation on hot-carrier reliability and degradation index in lateral diffused metal-oxide-semiconductor field-effect transistors Tian, Kuen-Shiuan; Chen, Jone F.; Chen, Shiang-Yu; Wu, Kuo-Ming; Lee, J. R.; Huang, Tsung-Yi; Liu, C. A.; Hsu, S. L.

Showing items 26-35 of 53  (6 Page(s) Totally)
<< < 1 2 3 4 5 6 > >>
View [10|25|50] records per page