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Showing items 1-3 of 3 (1 Page(s) Totally) 1 View [10|25|50] records per page
國立交通大學 |
2014-12-08T15:25:06Z |
Process induced instability and reliability issues in low temperature poly-Si thin film transistors
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Chen, Chih-Yang; Wang, Shen-De; Shieh, Ming-Shan; Chen, Wei-Cheng; Lin, Hsiao-Yi; Yeh, Kuan-Lin; Lee, Jam-Wen; Lei, Tan-Fu |
國立交通大學 |
2014-12-08T15:14:47Z |
A floating gate design for electrostatic discharge protection circuits
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Chou, Hung-Mu; Lee, Jam-Wen; Li, Yiming |
國立交通大學 |
2014-12-08T15:06:44Z |
An optimal silicidation technique for electrostatic discharge protection sub-100 nm CMOS devices in VLSI circuit
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Yu, Shao-Ming; Lee, Jam-Wen; Li, Yiming |
Showing items 1-3 of 3 (1 Page(s) Totally) 1 View [10|25|50] records per page
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