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"lee kuen jong"的相关文件
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| 臺大學術典藏 |
2020-06-11T06:58:53Z |
A Software-Based Test Methodology for Direct-Mapped Data Cache.
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Lin, Yi-Cheng;Tsai, Yi-Ying;Lee, Kuen-Jong;Yen, Cheng-Wei;Chen, Chung-Ho; Lin, Yi-Cheng; Tsai, Yi-Ying; Lee, Kuen-Jong; Yen, Cheng-Wei; Chen, Chung-Ho; YI-CHENG LIN |
| 國立成功大學 |
2015-05-15 |
System and method for temperature sensing of three-dimensional integrated circuit
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Chang, Soon-Jyh;Chen, Peng-Yu;Lee, Kuen-Jong;Chen, Chung-Ho |
| 國立成功大學 |
2014-12 |
Efficient LFSR Reseeding Based on Internal-Response Feedback
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Lien, Wei-Cheng; Lee, Kuen-Jong; Hsieh, Tong-Yu; Chakrabarty, Krishnendu |
| 國立成功大學 |
2014-03 |
On Deadlock Problem of On-Chip Buses Supporting Out-of-Order Transactions
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Chang, Chin-Yao; Lee, Kuen-Jong |
| 國立成功大學 |
2014-01 |
Capture-Power-Safe Test Pattern Determination for At-Speed Scan-Based Testing
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Li, Yi-Hua; Lien, Wei-Cheng; Lin, Ing-Chao; Lee, Kuen-Jong |
| 國立成功大學 |
2013-08 |
An Efficient On-Chip Test Generation Scheme Based on Programmable and Multiple Twisted-Ring Counters
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Lien, Wei-Cheng; Lee, Kuen-Jong; Hsieh, Tong-Yu; Ang, Wee-Lung |
| 國立成功大學 |
2013-01 |
Counter-Based Output Selection for Test Response Compaction
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Lien, Wei-Cheng; Lee, Kuen-Jong; Hsieh, Tong-Yu; Chakrabarty, Krishnendu; Wu, Yu-Hua |
| 國立成功大學 |
2012-11-22 |
A Test-Per-Clock LFSR Reseeding Algorithm for Concurrent Reduction on Test Sequence Length and Test Data Volume
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Lien, Wei-Cheng; Lee, Kuen-Jong; Hsieh, Tong-Yu |
| 國立成功大學 |
2012-05 |
Efficient Overdetection Elimination of Acceptable Faults for Yield Improvement
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Lee, Kuen-Jong; Hsieh, Tong-Yu; Breuer, Melvin A. |
| 國立成功大學 |
2011-10 |
Test Response Compaction via Output Bit Selection
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Lee, Kuen-Jong; Lien, Wei-Cheng; Hsieh, Tong-Yu |
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