| 國立成功大學 |
2002-08 |
An efficient BIST method for distributed small buffers
|
Jone, W. B.; Huang, D. C.; Wu, S. C.; Lee, Kuen-Jong |
| 國立成功大學 |
2002-04 |
A current-mode BIST structure of DACs
|
Wen, Yun-Che; Lee, Kuen-Jong |
| 國立成功大學 |
2002-02 |
Untitled
|
Lee, Kuen-Jong; Su, Chau-Chin |
| 國立成功大學 |
2002-02 |
An efficient deterministic test pattern generator for scan-based BIST environment
|
Wang, Wei-Lun; Lee, Kuen-Jong |
| 國立成功大學 |
2001-10 |
An on-chip march pattern generator for testing embedded memory cores
|
Wang, Wei-Lun; Lee, Kuen-Jong; Wang, Jhing-Fa |
| 國立成功大學 |
2001-07 |
Reduction of power consumption in scan-based circuits during test application by an input control technique
|
Huang, Tsung-Chu; Lee, Kuen-Jong |
| 國立彰化師範大學 |
2001-07 |
Reduction of Power Consumption in Scan-based Circuits During Test Application by an Input Control Technique
|
Huang, Tsung-Chu; Lee, Kuen-Jong |
| 國立成功大學 |
2001-05-24 |
Token scan cell for low power testing
|
Huang, Tsung-Chu; Lee, Kuen-Jong |
| 國立彰化師範大學 |
2001-05 |
Token Scan Cell for Low Power Testing
|
Huang, Tsung-Chu; Lee, Kuen-Jong |
| 國立成功大學 |
2001-01 |
Analysis and generation of control and observation structures for analog circuits
|
Wen, Yun-Che; Lee, Kuen-Jong |
| 國立彰化師範大學 |
2001 |
A Token Scan Architecture for Low Power Testing
|
Huang, Tsung-Chu; Lee, Kuen-Jong |
| 國立彰化師範大學 |
2001 |
A Low-Power LFSR Architecture
|
Huang, Tsung-Chu; Lee, Kuen-Jong |
| 國立成功大學 |
2000-01 |
Reducing test application time by scan flip-flops sharing
|
Chan, S. C.; Lee, Kuen-Jong; Wu, Z. Z.; Jone, W. B. |
| 南台科技大學 |
2000 |
CMOS 電路之臨界邏輯與臨界電壓之研究
|
唐經洲 ; 李昆忠 ; Tang, Jing-Jou ; Lee, Kuen-Jong |
| 國立彰化師範大學 |
2000 |
Peak-power Reduction for Multiple-scan Circuits During Test Application
|
Lee, Kuen-Jong; Huang, Tsung-Chu; Chen, Jih-Jeen |
| 國立成功大學 |
1999-12 |
Broadcasting test patterns to multiple circuits
|
Lee, Kuen-Jong; Chen, Jih-Jeen; Huang, Cheng-Hua |
| 國立成功大學 |
1999-04 |
A current-mode testable design of operational transconductance amplifier-capacitor filters
|
Lee, Kuen-Jong; Wang, Wei-Chiang; Huang, Kou-Shung |
| 國立彰化師範大學 |
1999-04 |
BIFEST: A Built-in Intermediate Fault Effect Sensing and Test Generation System for Cmos Bridging Faults
|
Lee, Kuen-Jong; Tang, Jing-Jou; Huang, Tsung-Chu |
| 南台科技大學 |
1999 |
深次微米CMOS電路之非定值錯誤測試法研究
|
唐經洲 ; 李昆忠 ; 陳順智 ; Tang, Jing-Jou ; Lee, Kuen-Jong ; Chen, Shung-Chih |
| 國立彰化師範大學 |
1999 |
An Input Control Technique for Power Reduction in Scan Circuits During Test Application
|
Huang, Tsung-Chu; Lee, Kuen-Jong |
| 國立成功大學 |
1998-06-11 |
BIST structure for DAC testing
|
Wen, Yun-Che; Lee, Kuen-Jong |
| 國立彰化師範大學 |
1997 |
A High-Speed Low-Voltage Built-In Current Sensor
|
Huang, Tsung-Chu; Huang, Min-Cheng; Lee, Kuen-Jong |
| 國立彰化師範大學 |
1997 |
Built-In Current Sensor Designs Based on the Bulk-Driven Technique
|
Huang, Tsung-Chu; Huang, Min-Cheng; Lee, Kuen-Jong |
| 南台科技大學 |
1996-04 |
A built-in current sensor based on current-mode design
|
唐經洲 ; Tang, Jing-Jou; 李昆忠 ; Lee, Kuen-Jong; 劉濱達 ; Liu, Bin-Da |
| 國立彰化師範大學 |
1996 |
Combination of Automatic Test Pattern Generation and Built-in Intermediate Voltage Sensing for Detecting CMOS Bridging Faults
|
Lee, Kuen-Jong; Tang, Jing-Jou; Huang, Tsung-Chu; Tsai, Cheng-Liang |
