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| 國立成功大學 |
2013-04 |
Characterization of Oxide Traps in 28 nm n-Type Metal-Oxide-Semiconductor Field-Effect Transistors with Different Uniaxial Tensile Stresses Utilizing Random Telegraph Noise
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Wang, Bo-Chin; Wu, San-Lein; Lu, Yu-Ying; Huang, Chien-Wei; Wu, Chung-Yi; Lin, Yu-Min; Lee, Kun-Hsien; Cheng, Osbert; Huang, Po-Chin; Chang, Shoou-Jinn |
| 國立成功大學 |
2012-07 |
Correlation Between Random Telegraph Noise and 1/f Noise Parameters in 28-nm pMOSFETs With Tip-Shaped SiGe Source/Drain
|
Wang, Bo Chin; Wu, San Lein; Huang, Chien Wei; Lu, Yu Ying; Chang, Shoou Jinn; Lin, Yu Min; Lee, Kun Hsien; Cheng, Osbert |
| 國立成功大學 |
2012-02 |
Characterization of Oxide Tarps in 28 nm p-Type Metal-Oxide-Semiconductor Field-Effect Transistors with Tip-Shaped SiGe Source/Drain Based on Random Telegraph Noise
|
Wang, Bo Chin; Wu, San Lein; Huang, Chien Wei; Lu, Yu Ying; Chang, Shoou Jinn; Lin, Yu Min; Lee, Kun Hsien; Cheng, Osbert |
| 國立成功大學 |
2011-08-25 |
符合3GPP-LTE系統規格之可變長度快速傅立葉轉換處理器設計與實現
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李昆憲; Lee, Kun-Hsien |
| 國立臺灣大學 |
2009 |
機車觸媒轉化器毒化現象探討
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李坤賢; Lee, Kun-Hsien |
Showing items 1-5 of 5 (1 Page(s) Totally)
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