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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立交通大學 2014-12-08T15:16:07Z Current properties of GaNV-defect using conductive atomic force microscopy Lee, Lino; Ku, Ching-Shun; Ke, Wen-Cheng; Ho, Chih-Wei; Huang, Huai-Ying; Lee, Ming-Chih; Chen, Wen-Hsiung; Chou, Wu-Chin; Chen, Wei-Kuo

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