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Showing items 1-7 of 7 (1 Page(s) Totally)
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| 臺大學術典藏 |
2020-06-16T06:33:19Z |
BEOL TDDB reliability modeling and lifetime prediction using critical energy to breakdown.
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Chen, Pin-Shiang;Lee, Shou-Chung;Oates, A. S.;Liu, Chee Wee; Chen, Pin-Shiang; Lee, Shou-Chung; Oates, A. S.; Liu, Chee Wee; CHEE-WEE LIU |
| 國立交通大學 |
2017-04-21T06:49:41Z |
Limitation of low-k reliability due to dielectric breakdown at vias
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Lee, Shou-Chung; Oates, A. S.; Chang, Kow Ming |
| 國立交通大學 |
2017-04-21T06:49:40Z |
FUNDAMENTAL UNDERSTANDING OF POROUS LOW-K DIELECTRIC BREAKDOWN
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Lee, Shou-Chung; Oates, A. S.; Chang, Kow-Ming |
| 國立交通大學 |
2015-12-02T03:00:54Z |
Exploring Location-Related Data on Smart Phones for Activity Inference
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Ruan, Xiao-Wen; Lee, Shou-Chung; Peng, Wen-Chih |
| 國立交通大學 |
2014-12-12T02:14:46Z |
砷離子佈植砷化鎵薄膜在不同退火條件下其材料結構與電性分析
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李守忠; Lee, Shou-Chung; 張振雄; Chen-Shiung Chang |
| 國立交通大學 |
2014-12-12T01:21:34Z |
低介電係數材料應用於銅導線內連接製程之可靠度研究
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李守忠; Lee, Shou-Chung; 張國明; Chang, Kow-Ming |
| 國立交通大學 |
2014-12-08T15:48:26Z |
Geometric Variability of Nanoscale Interconnects and Its Impact on the Time-Dependent Breakdown of Cu/Low-k Dielectrics
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Lee, Shou-Chung; Oates, Anthony S.; Chang, Kow-Ming |
Showing items 1-7 of 7 (1 Page(s) Totally)
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